Semiconductor Etching via Protective Mask Layers

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Solution Overview

Problem

Current semiconductor fabrication methods face challenges in efficiently forming precise patterns and etching openings in semiconductor substrates without contamination or damage, particularly when using plasma etching processes.

Innovation Solution

A method involving the formation of a patterned metallic layer, followed by coating with a protective layer, and subsequent etching using a mask comprising layers that prevent contamination and facilitate controlled etching through processes like plasma etching, to create trenches or holes in semiconductor substrates.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If plasma etching process is used to etch semiconductor substrate, then etching efficiency is improved, but substrate contamination and damage occur

Engineering Contradiction:
Improveetching efficiencyVSAvoidsubstrate contamination and damage
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

A protective coating layer is applied as an intermediary between the plasma etching process and the semiconductor substrate. This coating layer allows the plasma to perform etching efficiently while preventing direct contact between the plasma and substrate, thereby avoiding contamination and damage. The coating layer acts as a mediator that enables the beneficial etching action while blocking the harmful effects.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The protective coating layer is applied to the substrate before the plasma etching process begins. This preliminary action prepares the substrate by creating a protective barrier in advance, ensuring that when the plasma etching occurs, the substrate is already protected from contamination and damage while still allowing the etching to proceed efficiently.

Inventive Principle:
Principle #10Preliminary action

2Manufacturing precision

If patterned metallic layer is formed over substrate, then desired patterns can be created, but process complexity increases

Engineering Contradiction:
Improvepattern precisionVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The protective coating layer serves multiple functions simultaneously: it protects the substrate from plasma damage, enables precise pattern formation, and facilitates the etching process. By combining these functions into a single layer, the patent reduces overall process complexity while maintaining high pattern precision, as the same layer that protects also enables the patterning.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables precise and contamination-free etching of semiconductor substrates, allowing for the formation of desired patterns and structures while protecting the substrate from damage during etching processes.

Implementation Method 1

etching using a mask comprising layers that prevent contamination and facilitate controlled etching through processes like plasma etching

Methodology Applied
Scientific EffectPlasma etching: Plasma

Data Source

PatentUS8993437B2Method for etching substrate
Publication Date: 2015.03.31 INFINEON TECHNOLOGIES AG
  • US8993437B2 patent drawing
  • US8993437B2 patent drawing
  • US8993437B2 patent drawing

AI summary

One or more embodiments relate to a method of making a semiconductor structure, comprising: forming a patterned metallic layer over a semiconductor substrate; forming a second layer over the patterned metallic layer; and etching the substrate.