Semiconductor Examination Device Current Cutoff Timing
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Solution Overview
Problem
Existing semiconductor examination devices allow current to flow into broken devices after breakdown detection, causing further damage and progression of breakdown, as the current cutoff occurs only after voltage stabilization.
Innovation Solution
An examination device with a current cutoff mechanism that starts cutting off current flow before voltage stabilization after a surge, triggered by the semiconductor device turning off, and completes the cutoff before the voltage stabilizes, using a power source, inductor, diode, and gate voltage control circuit to apply a sufficient load and restrain breakdown progression.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the current cutoff mechanism starts cutting off current only after breakdown detection, then the semiconductor device can be examined with sufficient load, but the breakdown progression causes damage to the examination device
Solution Approach 1:
The current cutoff mechanism starts cutting off current before voltage stabilization occurs after surge. This preliminary action prevents breakdown progression by removing current supply at the critical moment when voltage is still rising, rather than waiting for breakdown detection after voltage has already stabilized.
Solution Approach 2:
The system monitors voltage stabilization status and uses this feedback to control the current cutoff timing. The cutoff mechanism is triggered based on real-time voltage characteristics, creating a closed-loop control system that adapts to the semiconductor device's actual state during examination.
2Object-affected harmful factors
If the current cutoff completes before voltage stabilization, then breakdown progression is restrained, but the load application timing must be precisely controlled
Solution Approach 1:
The current cutoff is designed to complete before voltage stabilization occurs naturally after surge. This timing arrangement ensures that the harmful current is removed in advance, preventing breakdown progression without requiring complex real-time adjustment mechanisms during the critical voltage rise period.
3Power
If current flows until voltage stabilization, then sufficient load is applied to the semiconductor device, but current continues to flow into broken devices causing further damage
Solution Approach 1:
The current cutoff mechanism applies preliminary anti-action by removing current supply before voltage stabilization completes. This prevents the harmful effect of current flowing into broken devices while still allowing sufficient load to be applied during the examination period, effectively counteracting potential damage before it occurs.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables the application of a sufficient load to semiconductor devices and effectively restrains the progression of breakdowns, even when devices fail, by controlling the current cutoff timing relative to voltage stabilization, reducing damage and burden on the examination device.
Implementation Method 1
an inductor provided between the power source and the semiconductor device
Implementation Method 2
a diode connected in parallel with the inductor, and having an anode connected to a negative side of the inductor and a cathode connected to a positive side of the inductor
Data Source
AI summary
An examination device disclosed herein includes: a power source; an inductor provided between the power source and the semiconductor device; a diode connected in parallel with the inductor, and having an anode connected to a negative side of the inductor and a cathode connected to a positive side of the inductor; and a current cutoff mechanism provided between the power source and the semiconductor device, and configured to cut off an inflow of current to the semiconductor device, wherein the current cutoff mechanism starts to cut off the inflow of the current to the semiconductor device before a timing at which voltage that is applied to the semiconductor device is stabilized, after having experienced a rise to surge voltage, the rise having been triggered by the semiconductor device being turned off, and the current cutoff mechanism completes the cutoff after the timing.