Failure Estimation for Semiconductor Devices Using Operational History
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Solution Overview
Problem
The accuracy of failure estimation for semiconductor devices in factory automation instruments is lower due to stringent specifications and limited improvement from existing power cycle life estimation methods, as these tests are conducted under more severe conditions than actual operational environments.
Innovation Solution
A failure estimation method and apparatus that utilize history information from instruments with the same type of semiconductor devices to classify operating states and update life estimation algorithms based on actual usage conditions, improving estimation accuracy by considering various stress levels and environments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If power cycle life estimation method is used, then failure estimation can be performed, but estimation accuracy is lower than expected due to stringent specifications and deviation from actual operational conditions
Solution Approach 1:
The patent changes the parameters used in life estimation from standardized power cycle test parameters to actual operational parameters collected from field devices. It uses real temperature, voltage, current, and load data from actual device operation to dynamically adjust the life estimation model, making it adaptable to diverse operational conditions while improving accuracy.
Solution Approach 2:
The patent implements feedback by continuously monitoring actual device operation data and using it to update and refine the life estimation. Historical failure data and real-time operational parameters are fed back into the estimation model to improve its accuracy over time and adapt to actual usage patterns rather than relying solely on standardized test data.
2Stability of the object's composition
If standardized power cycle test conditions are used, then consistent estimation methodology is achieved, but estimation accuracy deteriorates due to deviation from actual usage environments
Solution Approach 1:
The patent transitions from static standardized test conditions to dynamic actual operational conditions. It continuously collects and processes real-time data from devices in various operational states, allowing the estimation model to adapt to changing temperature, voltage, load, and usage patterns that reflect actual field conditions rather than fixed test parameters.
Solution Approach 2:
The patent creates a universal estimation system that can handle multiple types of operational conditions through classification. It categorizes devices into different usage groups (e.g., continuous operation, intermittent operation, high temperature, low temperature) and applies appropriate estimation models for each, making the system universally applicable across diverse real-world scenarios while maintaining methodological consistency within each category.
Data Source
AI summary
There is a need to improve estimation accuracy of a failure estimation method or its failure estimation apparatus that performs failure estimation on a targeted instrument based on history information about several instruments mounted with the same type of semiconductor device as an instrument targeted at failure estimation. A failure estimation apparatus that includes a history information database storing history information about a plurality of instruments mounted with the same type of semiconductor device and performs failure estimation on a targeted instrument mounted with a semiconductor device whose type equals the type, wherein the history information contains operation information and failure information; wherein the operation information indicates a chronological operating state of the semiconductor device mounted on the instruments; wherein the failure information indicates a failure cause of a failed instrument; and wherein the operating state is categorized into a plurality of classifications.