Semiconductor Device With Floating Trenches For Adjustable Capacitance

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional reverse conducting-IGBTs experience increased turn-on power loss due to a tailing voltage shape and high collector-emitter gate capacitance, which is not adjustable, leading to inefficient power conversion in power semiconductor devices.

Innovation Solution

The semiconductor device incorporates gate trench structures with a gate potential electrode and floating trench structures with a floating potential electrode, along with emitter trench structures, on a semiconductor substrate, where the floating trench structures are more numerous in the diode region, allowing for adjustable drain-source capacitance by varying the ratio of emitter and floating trench structures, reducing turn-on power loss.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of energy

If conventional RC-IGBT structure with fixed gate trenches is used, then device integration is achieved, but turn-on power loss increases due to uncontrollable gate capacitance

Engineering Contradiction:
Improveturn-on power lossVSAvoidcapacitance adjustability
Core Design Contradiction:
Loss of energyVSAdaptability or versatility

Solution Approach 1:

The gate trench structures are segmented into multiple independent trenches, each with its own electrode. This segmentation allows individual control of capacitance contribution from each trench, enabling adjustable total gate capacitance by selectively connecting or disconnecting specific trench electrodes, thereby reducing turn-on power loss through optimized capacitance control.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The gate trench structures are designed with dynamic connectivity options, where electrodes in different trenches can be selectively connected to the gate electrode or left floating. This dynamic configuration allows the device to adjust its effective gate capacitance based on operating conditions, optimizing turn-on performance and reducing power loss.

Inventive Principle:
Principle #15Dynamics

2Adaptability or versatility

If gate trench structures are added to control capacitance, then capacitance adjustability improves, but device structure becomes more complex

Engineering Contradiction:
Improvecapacitance adjustabilityVSAvoidtrench structure complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The gate trench structures serve multiple functions: they provide gate control for the IGBT, enable adjustable capacitance through selective electrode connection, and maintain device integration. By making the trench structures multi-functional, the patent achieves capacitance adjustability without proportionally increasing device complexity, as the same structural elements perform multiple roles.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Loss of energy

If floating trench structures are introduced, then capacitance control improves, but manufacturing process becomes more difficult

Engineering Contradiction:
Improveturn-on power lossVSAvoidtrench structure fabrication
Core Design Contradiction:
Loss of energyVSEase of manufacture

Solution Approach 1:

The gate trench structures and floating trench structures are merged into a unified trench system that can be fabricated using the same manufacturing processes. By combining the functionality of gate trenches and floating trenches into a single integrated structure, the patent reduces manufacturing complexity while maintaining the ability to control capacitance and reduce turn-on power loss.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS10763252B2Semiconductor device
Publication Date: 2020.09.01 FUJI ELECTRIC CO LTD
  • US10763252B2 patent drawing
  • US10763252B2 patent drawing
  • US10763252B2 patent drawing

AI summary

A semiconductor device including a semiconductor substrate and a plurality of trench structures formed on the semiconductor substrate. The semiconductor substrate includes a first element region for forming an insulated gate bipolar transistor therein, and a second element region for forming a diode therein, the semiconductor substrate constituting a drift layer. The plurality of trench structures includes a plurality of gate trench structures provided on a front surface side of the first element region, each gate trench structure having an electrode provided therein that is based on a gate potential, and a plurality of floating trench structures provided on a front surface side of the second element region, each floating trench structure having an electrode provided therein that has a floating potential.