Semiconductor Fuse Array Repair with Remaining Fuse Information
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing semiconductor apparatuses face challenges in performing stable repair operations after packaging, particularly in reducing the number of latches required for redundancy and efficiently updating fuse information.
Innovation Solution
A semiconductor apparatus with a fuse array divided into groups, a memory region, and a control unit that scans and updates remaining fuse information, allowing for efficient detection and storage of fail addresses and rupture of unused fuse sets to facilitate repair operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fuse array is used to store fail addresses for repair operations, then the reliability of the semiconductor apparatus is improved, but the device complexity increases due to additional fuse groups and information storage units
Solution Approach 1:
The fuse array is divided into multiple fuse groups, each responsible for storing fail addresses of specific memory regions. This segmentation allows the system to manage redundancy information in an organized manner, improving reliability while controlling complexity through modular structure.
Solution Approach 2:
The remaining fuse information storage unit pre-stores information about available fuse groups before repair operations are needed. This preliminary preparation enables the control unit to quickly identify and select appropriate fuse groups for repair without adding complex real-time decision logic.
2Device complexity
If the number of latches is reduced to simplify the device, then the device complexity decreases, but the ability to store and manage fail address information may be compromised
Solution Approach 1:
The remaining fuse information storage unit serves multiple functions: it stores information about available fuse groups, tracks which fuse groups have been used, and provides this information to the control unit for repair operations. This multi-functionality reduces the need for separate dedicated storage elements, thereby reducing the number of latches while maintaining reliability.
3Productivity
If fuse information is updated frequently during repair operations, then the repair efficiency is improved, but the use of energy increases due to multiple scanning and updating operations
Solution Approach 1:
The remaining fuse information is stored in advance in the remaining fuse information storage unit before repair operations begin. This preliminary storage eliminates the need for frequent scanning and updating of fuse information during repair operations, thereby improving repair efficiency while reducing energy consumption.
Solution Approach 2:
The control unit automatically uses the pre-stored remaining fuse information to identify and select appropriate fuse groups for repair operations without requiring continuous external input or re-scanning. This self-service approach improves operational efficiency while minimizing energy consumption by avoiding repeated information retrieval operations.
Data Source
AI summary
A semiconductor apparatus includes a memory region; a fuse array including a plurality of fuse groups, each fuse group being configured to store a failed address of the memory region; a remaining-fuse information storage unit configured to store remaining-fuse information on a fuse group that includes a fuse corresponding to the failed address among the plurality of fuse groups; and a control unit configured to perform a control operation for updating the remaining-fuse information for the fuse group that includes a fuse corresponding to the failed address among the plurality of fuse groups and for storing the failed address when the failed address is detected.