Semiconductor Fuse Redundancy for Signal Stability
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Solution Overview
Problem
Semiconductor devices with fuses or antifuses face reliability issues due to the likelihood of reconnection or redisconnection over time, affecting the output of signal output units, as existing methods like laser irradiation and current loading are inefficient and costly, and may require additional manufacturing steps and heat treatments that can cause reconnection.
Innovation Solution
A semiconductor device design incorporating a signal output unit with multiple fuses or antifuses and a decision unit that determines the disconnection or connection status, using a logic gate to ensure that a predetermined number of fuses or antifuses are disconnected or connected, reducing the probability of reconnection or redisconnection and thereby stabilizing the output.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If laser irradiation or current loading is used to disconnect the fuse, then the disconnection can be achieved, but the fuse may reconnect over time due to heat treatment or manufacturing processes
Solution Approach 1:
The invention divides the fuse structure into multiple segments (first fuse and second fuse) connected in series. This segmentation ensures that even if one fuse reconnects, the other remains disconnected, maintaining the overall open circuit state and preventing reconnection issues
Solution Approach 2:
The invention places the fuse in series with a pull-down resistor before the output terminal. This resistor acts as a cushioning element that ensures the output terminal maintains a stable low level signal even if the fuse reconnects, preventing unwanted signal changes and ensuring reliable operation
2Reliability
If multiple fuses are used in the signal output unit, then the complete disconnection is substantially assured, but the device complexity increases
Solution Approach 1:
The invention uses exactly two fuses (first and second fuse) in series configuration, which is the minimum number needed to ensure disconnection completeness while avoiding excessive complexity. This segmented approach provides redundancy without over-engineering the system
Solution Approach 2:
The invention combines the fuse disconnection function with the pull-down resistor in a unified circuit configuration. The pull-down resistor serves dual purposes: ensuring stable low level output and providing a simple verification mechanism for fuse status, thereby reducing overall system complexity
3Reliability
If heat treatment or additional manufacturing steps are applied to ensure fuse disconnection, then the disconnection reliability improves, but the manufacturing cost and process complexity increase
Solution Approach 1:
The invention uses a simple current loading method to disconnect the fuse, which is self-contained and does not require external laser equipment or specialized heat treatment processes. The pull-down resistor automatically maintains the low level signal without requiring additional control circuits or manufacturing steps
Solution Approach 2:
The invention employs standard, inexpensive components such as pull-down resistors and simple fuse structures that can be easily manufactured using conventional semiconductor fabrication processes, avoiding the need for costly laser irradiation equipment or complex heat treatment facilities
Data Source
AI summary
A semiconductor device includes a signal output unit, and a decision unit. The signal output unit includes m (≧2) pieces of fuses, a NAND gate, resistance elements, and an output terminal. The decision unit decides whether n or more pieces (m≧n≧2) of fuses are disconnected out of the m pieces of fuses included in the signal output unit, and outputs the result of a decision. When m=n=2, the decision unit is constituted of a NOR gate having two input terminals connected to a respective end of the fuses. Thus, a H-level potential signal is output at an output terminal of the NOR gate when the decision result is affirmative. On the other hand, when the decision result is negative, a L-level potential signal is output at the output terminal.