Semiconductor Fuse Terminal Reuse for Stable Rupture Voltage
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Solution Overview
Problem
Existing semiconductor integrated circuits face challenges in supplying precise and stable rupture bias voltages, leading to increased circuit area and design complexity, especially when generating these voltages internally or receiving them from external equipment.
Innovation Solution
A semiconductor integrated circuit design that utilizes existing terminals for normal operations to receive external signals for fuse rupture operations, eliminating the need for dedicated rupture bias terminals, and employs control units to apply appropriate external signals to the fuse set for stable voltage application.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If rupture bias voltages are generated using internal power sources, then the electronic fuse can be used after packaging, but the circuit area increases and voltage stability decreases
Solution Approach 1:
The patent reuses existing power supply terminals (VDD and VBB terminals) that are already present for normal circuit operation to also serve as terminals for applying rupture bias voltages during fuse rupture operations. This multi-functional use of terminals eliminates the need for additional dedicated terminals, thereby maintaining fuse operability after packaging while avoiding increases in circuit area.
2Ease of operation
If dedicated terminals are added for receiving rupture bias voltages from external equipment, then voltage application becomes simpler, but the circuit area increases and design complexity increases
Solution Approach 1:
The patent enables existing power supply terminals to serve dual purposes: supplying power during normal operation and receiving rupture bias voltages during fuse rupture operations. This approach maintains ease of operation by allowing external voltage application through standard terminals while avoiding the design complexity and area increase associated with adding dedicated rupture bias terminals.
3Adaptability or versatility
If internal power sources are used to generate rupture bias voltages, then external equipment is not needed, but the number of charge pumps increases and voltage precision decreases
Solution Approach 1:
The patent introduces a control unit that acts as an intermediary between external test equipment and the fuse. This control unit receives rupture bias voltages from external equipment through existing power supply terminals and applies them to the fuse, thereby maintaining voltage precision while preserving independence from complex internal power generation circuits.
4Area of stationary object
If existing terminals are reused for both normal operation and fuse rupture operations, then circuit area is reduced and design efficiency improves, but terminal signal conflict may occur
Solution Approach 1:
The patent implements dynamic terminal functionality through a control unit that changes the purpose of existing terminals based on operational mode. During normal operation, terminals supply power to the circuit; during fuse rupture operations, the same terminals receive rupture bias voltages from external equipment. This dynamic reconfiguration reduces circuit area while maintaining signal stability through mode-dependent terminal assignment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for stable rupture bias voltage supply while reducing circuit area and improving design efficiency by reusing terminals for both normal and fuse rupture operations, ensuring precise and stable voltage application to the fuses.
Implementation Method 1
rupture bias voltages are applied to a source, a drain and a gate commonly connected with one another to rupture a gate oxide Gox so that the gate, the source, the drain and a bulk are connected with one another
Data Source
AI summary
A semiconductor integrated circuit includes a fuse set; a terminal assigned to be applied with a first external signal in a normal operation; and a control unit configured to receive a second external signal through the terminal and apply the received second external signal to the fuse set in a fuse control operation.