Semiconductor Fuse Trimming Circuit Abnormal State Detection
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Solution Overview
Problem
Conventional semiconductor devices face difficulties in detecting whether two fuses connected in series are correctly cut or in an abnormal state, as both correct and abnormal cut states can result in similar voltage readings, making it challenging to differentiate between them.
Innovation Solution
A semiconductor device is designed with a trimming circuit, current source circuit, and determination circuit that uses specific current settings and control signals to differentiate between the correct and abnormal cut states of the fuses by analyzing signal levels at specific nodes, allowing for accurate detection of abnormal cut states without damaging the fuses.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If two fuses are connected in series to switch circuit characteristics, then circuit trimming functionality is improved, but detection of abnormal cut states becomes difficult
Solution Approach 1:
A determination circuit is introduced as an intermediary component between the trimming circuit and the external environment. This circuit includes a detection fuse connected in parallel with the series combination of the first and second fuses, along with associated switching elements and signal processing circuitry. The determination circuit mediates the detection process by converting the fuse cut states into distinguishable voltage signals that can be externally observed, thereby solving the detection difficulty without affecting the original trimming functionality.
Solution Approach 2:
The determination circuit provides feedback about the cut state of the fuses by generating distinct voltage signals corresponding to different cut configurations. When the first fuse is cut and the second fuse is intact, one voltage signal is generated; when both fuses are cut, a different voltage signal is generated. This feedback mechanism allows external systems to verify the correct operation of the trimming circuit and detect abnormal states, resolving the detection problem while preserving the adaptability of the circuit trimming function.
2Ease of operation
If voltage measurement is used to detect fuse cut state, then detection simplicity is improved, but measurement precision deteriorates due to identical voltage readings in different states
Solution Approach 1:
The detection function is segmented into multiple independent components: a detection fuse connected in parallel with the series fuses, switching elements controlled by control signals, and signal processing circuitry. This segmentation allows the system to generate different voltage signals for different fuse cut states by selectively connecting or disconnecting the detection fuse, thereby achieving both simple voltage-based detection and precise state differentiation.
Solution Approach 2:
The determination circuit changes the voltage parameter based on the fuse cut state. When the first fuse is cut and the second fuse is intact, the circuit generates a first voltage signal at a specific level. When both fuses are cut, the circuit generates a second voltage signal at a different level. This parameter change in voltage level allows precise differentiation between cut states while maintaining the simplicity of voltage-based detection.
Data Source
AI summary
Provided is a semiconductor device capable of detecting an abnormal state in which two fuses are both short-circuited or cut. The semiconductor device includes: a trimming circuit having a first fuse and a second fuse connected in series; a current source circuit configured to supply current to the trimming circuit; and a determination circuit configured to determine whether a connection state or disconnect state of the first fuse and the second fuse are abnormal or not based upon signals derived from an output signal of the trimming circuit.