Semiconductor Device Gate Electrode Positioning

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Solution Overview

Problem

Vertical transistors with increased density on a substrate experience slower switching speeds due to narrowed spacing between gate electrodes, leading to reduced operation speed and increased parasitic capacitance, making it difficult to respond to high-speed signals.

Innovation Solution

The semiconductor device design includes a semiconductor layer with first and second channel portions extending in a direction crossing the substrate surface, connected by interconnections and a control electrode positioned between them, which is electrically insulated from the semiconductor layer, thereby reducing parasitic capacitance and maintaining high-speed operation even at increased density.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If vertical transistors are placed on the substrate with higher density, then transistor density is improved, but spacing between gate electrodes is narrowed causing increased gate to gate capacitance and slower switching speed

Engineering Contradiction:
Improvetransistor densityVSAvoidswitching speed
Core Design Contradiction:
Quantity of substanceVSSpeed

Solution Approach 1:

The gate electrode is repositioned from a vertical configuration (above the channel) to a horizontal configuration (between channel portions along the substrate surface). This dimensional change in gate placement allows for reduced gate-to-gate spacing without increasing parasitic capacitance, enabling higher transistor density while maintaining fast switching speeds.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If spacing between gate electrodes is narrowed to increase density, then transistor density is improved, but gate to gate capacitance increases causing slower switching speed

Engineering Contradiction:
Improvetransistor densityVSAvoidgate to gate capacitance
Core Design Contradiction:
Quantity of substanceVSObject-generated harmful factors

Solution Approach 1:

The gate electrode is repositioned from a vertical configuration (above the channel) to a horizontal configuration (between channel portions along the substrate surface). This dimensional change in gate placement allows for reduced gate-to-gate spacing without increasing parasitic capacitance, enabling higher transistor density while maintaining fast switching speeds.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Quantity of substance

If vertical transistors are used for high density placement, then transistor density is improved, but switching speed decreases making it difficult to respond to high speed signals

Engineering Contradiction:
Improvetransistor densityVSAvoidresponse speed to high speed signals
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The gate electrode is repositioned from a vertical configuration (above the channel) to a horizontal configuration (between channel portions along the substrate surface). This dimensional change in gate placement allows for reduced gate-to-gate spacing without increasing parasitic capacitance, enabling higher transistor density while maintaining fast switching speeds.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS10535712B2Semiconductor device
Publication Date: 2020.01.14 KIOXIA CORP
  • US10535712B2 patent drawing
  • US10535712B2 patent drawing
  • US10535712B2 patent drawing

AI summary

A semiconductor device includes a substrate, a semiconductor layer, a first interconnection, a second interconnection and a control electrode. The semiconductor layer includes a first channel portion and a second channel portion. The first channel portion and the second channel portion extend in a first direction crossing a front surface of the substrate. The first interconnection is connected to one end of the semiconductor layer, and extends in a second direction along the front surface of the substrate. The second interconnection is connected to the other end of the semiconductor layer. The control electrode extends along the front surface of the substrate, and extends in a third direction crossing the second direction. The control electrode includes a portion positioned between the first channel portion and the second channel portion. The control electrode is electrically insulated from the semiconductor layer.