Semiconductor Device Handler for Electronic and Optical Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing semiconductor device testing apparatuses cannot effectively test semiconductor devices with both electronic and optical circuits due to the lack of capability to handle optical signals.
Innovation Solution
A semiconductor device handling apparatus that includes a holding portion with a second transmission portion to transmit optical signals between the optical connection portion of the device under test and a tester, enabling simultaneous testing of electronic and optical circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If an existing electronic component testing apparatus is used, then electrical characteristics of the DUT can be tested, but semiconductor devices with optical circuits cannot be tested
Solution Approach 1:
The holding portion is designed to perform multiple functions: holding the DUT, transmitting optical signals, and enabling both electrical and optical testing through a single integrated structure, making the apparatus capable of testing both electronic and photonic components
Solution Approach 2:
The holding portion acts as an intermediary between the DUT and the tester, providing the optical transmission function that bridges the gap between the electrical tester and the optical circuit of the DUT
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the testing of semiconductor devices with both electronic and optical circuits by facilitating the transmission of optical signals between the DUT and the tester, thereby expanding the testing capabilities of existing apparatuses.
Implementation Method 1
a second transmission portion (holder transmitter) transmitting a signal between an optical connection portion disposed on the second surface of the DUT and a first transmission portion (tester transmitter) of the tester
Data Source
AI summary
A semiconductor device handling apparatus handles a device under test (DUT) to bring a terminal disposed on a first surface of the DUT into contact with a contact portion of a tester comprising a tester transmitter. The semiconductor device handling apparatus includes a holder that holds a second surface of the DUT. The holder includes a holder transmitter that transmits a signal between an optical connection portion disposed on the second surface of the DUT and the tester transmitter. The holder transmitter inputs and outputs an optical signal to and from the optical connection portion.