Semiconductor Address Profiling via Hash-Based Circuit

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Solution Overview

Problem

Existing methods for profiling access times of semiconductor addresses, particularly in DRAM, are complex and inefficient, leading to increased dynamic noise and reduced cell retention times in neighboring cells due to the need for multiple counters and cumbersome counting processes.

Innovation Solution

A profiling method using a hash operation to generate a hash value from the input/output address, which is then used to determine access times and refresh frequencies, simplifying the profiling circuit and reducing the number of required counters by utilizing a storage unit with fewer entries and a controller to manage access times and refresh operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If 2^i counters are used to count the number of times each address is accessed, then the access times can be accurately profiled, but the circuit complexity becomes extremely high and impractical to implement

Engineering Contradiction:
Improveaccess time profiling accuracyVSAvoidprofiling circuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces a hash function as an intermediary component that transforms the original address into a hash value. This hash value serves as a mediator that maps the large address space into a smaller, manageable range that can be stored in a practical-sized table, thereby resolving the contradiction between accurate access time profiling and circuit complexity

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

Instead of directly counting accesses for every possible address using excessive counters, the patent creates a simplified copy representation through a hash table. The hash table stores only the necessary access count information for addresses that have been actually accessed, rather than maintaining counters for all possible addresses, thus reducing circuit complexity while preserving profiling accuracy

Inventive Principle:
Principle #26Copying

2Measurement precision

If the number of access times for each address is counted using traditional methods, then accurate profiling is achieved, but the storage requirements and operational complexity increase significantly

Engineering Contradiction:
Improveaccess count profiling accuracyVSAvoidprofiling operation simplicity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent transforms the addressing parameter from the original full address to a hash value derived from the address. This parameter change allows the system to work with a condensed representation that requires less storage and simpler operations, while the hash function ensures that the transformation preserves the necessary information for accurate access counting

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9305631B1Profiling method of address access count of semiconductor device and profiling circuit using the same
Publication Date: 2016.04.05 SAMSUNG ELECTRONICS CO LTD
  • US9305631B1 patent drawing
  • US9305631B1 patent drawing
  • US9305631B1 patent drawing

AI summary

Provided is a profiling unit and method for profiling a number of times that an input/output address of a semiconductor device is accessed. The profiling unit includes a hash unit configured to produce at least one hash value by perform a hash operation on the input/output address, and a profiling circuit configured to profile the number of times that the input/output address is accessed by using the at least one hash value.