Semiconductor Device High-Side Driver Surge Protection Circuit

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional semiconductor devices with half-bridge circuits face challenges in effectively protecting high-side drivers from surge voltages and overcurrents, leading to potential malfunction or destruction due to delayed interruption of high-side switching devices and increased counter-electromotive forces from parasitic inductances.

Innovation Solution

Incorporating a protection circuit section with a reverse blocking Zener diode and dynamic clamp circuit configurations, which absorb surge voltages and prevent destruction of high-side drivers by clamping voltages and managing surge currents, thereby protecting the high-side drivers and reducing the risk of malfunction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If high-side switching device interruption is delayed, then control flexibility is maintained, but counter-electromotive forces from parasitic inductances increase and may destroy the high-side driver

Engineering Contradiction:
Improvecontrol flexibilityVSAvoidcounter-electromotive forces
Core Design Contradiction:
Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The patent implements protection circuits with Zener diodes and clamp circuits before the harmful counter-electromotive forces can damage the high-side driver. These circuits are pre-configured to activate when surge voltages exceed safe levels, providing beforehand cushioning that clamps the voltage and diverts current away from the high-side driver during delayed interruption events.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

Solution Approach 2:

The protection circuits convert the harmful effect of delayed interruption and resulting surge voltages into a controlled event. The Zener diodes and clamp circuits deliberately break down or activate at predetermined voltage levels, transforming the potentially destructive surge into a controlled current path that protects the high-side driver while maintaining the delayed interruption benefit.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively absorbs surge voltages and prevents destruction of high-side drivers, ensuring reliable operation by quickly reacting to overvoltage conditions and reducing the risk of counter-electromotive forces, thus enhancing the semiconductor device's reliability and reducing the need for additional external countermeasures.

Implementation Method 1

a protection circuit section 60 which has a terminal a that is connected to a node extension unit 80 of high-side power supply potential, and a terminal b that is connected to a node extension unit 90 of reference potential of each phase

Methodology Applied
Scientific EffectZener breakdown: Avalanche Breakdown

Implementation Method 2

Incorporating a protection circuit section with a reverse blocking Zener diode and dynamic clamp circuit configurations, which absorb surge voltages and prevent destruction of high-side drivers by clamping voltages and managing surge currents

Methodology Applied
Scientific EffectClamping:

Data Source

PatentUS11606090B2Semiconductor device
Publication Date: 2023.03.14 FUJI ELECTRIC CO LTD
  • US11606090B2 patent drawing
  • US11606090B2 patent drawing
  • US11606090B2 patent drawing

AI summary

Provided is a semiconductor device comprising a high-side switching device, a low-side switching device, a high-side driver configured to turn on/off the high-side switching device, a low-side driver configured to turn on/off the low-side switching device, a high-side driving external terminal configured to supply a power supply voltage for driving the high-side driver, and a protection circuit section connected to the high-side driving external terminal. The high-side driver may include a reference potential terminal set to a reference potential of the high-side driver. The protection circuit section may be connected between the high-side driving external terminal and the reference potential terminal.