Semiconductor Device Impedance Adjustment Layer for Signal Delay

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Solution Overview

Problem

The miniaturization of semiconductor devices leads to increased parasitic capacitance between wirings, resulting in signal delay (RC delay) issues due to reduced pitch between wiring patterns.

Innovation Solution

Incorporating an impedance adjustment layer, specifically made of VO2, between wirings to compensate for parasitic capacitance by functioning as a parallel LC circuit, reducing signal delay and enabling effective impedance adjustment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the pitch between wirings is reduced to increase integration, then higher integration is achieved, but parasitic capacitance increases causing signal delay

Engineering Contradiction:
Improveintegration densityVSAvoidsignal delay
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

An impedance adjustment layer is introduced as an intermediary between adjacent wirings to control and adjust the impedance characteristics. This intermediary layer compensates for parasitic capacitance effects and reduces signal delay while maintaining reduced pitch for high integration

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The impedance adjustment layer modifies the electrical parameters (impedance, capacitance) of the wiring structure by introducing a material with specific dielectric properties. This parameter change allows compensation for parasitic capacitance and reduction of RC delay while maintaining reduced wiring pitch

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The impedance adjustment layer effectively reduces signal delay by compensating for phase delays, allowing for faster signal propagation and supporting the miniaturization of semiconductor device structures.

Implementation Method 1

The reduction of the pitch between the wirings in the semiconductor device increases parasitic capacitance between the wirings

Methodology Applied
Scientific EffectParasitic capacitance: Parasitic Capacitance

Implementation Method 2

an impedance adjustment layer, specifically made of VO2, between wirings to compensate for parasitic capacitance by functioning as a parallel LC circuit

Methodology Applied
Scientific EffectLC circuit resonance: Resonance

Data Source

PatentUS11211288B2Semiconductor device
Publication Date: 2021.12.28 TOKYO ELECTRON LTD
  • US11211288B2 patent drawing
  • US11211288B2 patent drawing
  • US11211288B2 patent drawing

AI summary

There is provided a semiconductor device including: a first wiring; a second wiring; a dielectric layer configured to insulate the first wiring and the second wiring from each other; and an impedance adjustment layer formed between the first wiring and the second wiring, and configured to adjust an impedance between the first wiring and the second wiring.