In-situ Semiconductor Testing System for Aerospace Irradiation
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Solution Overview
Problem
There is a need for an effective system to test the performance of third-generation semiconductor devices in aerospace irradiation environments, which are prone to radiation-induced anomalies and failures.
Innovation Solution
An in-situ testing system comprising static and dynamic testing units, connected via channel switching control units, allowing for the output of static and dynamic signals and data, and alternating between testing modes to evaluate the semiconductor device's characteristics and degradation under aerospace conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple testing channels (static and dynamic) are integrated into a single system, then comprehensive performance testing capability is improved, but device complexity increases
Solution Approach 1:
The testing system is divided into separate static testing unit and dynamic testing unit, each with dedicated testing channels. The channel switching control unit manages which channel is active at any given time, allowing comprehensive testing capability while maintaining manageable system complexity through modular segmentation.
Solution Approach 2:
The system employs dynamic channel switching between static and dynamic testing modes. The channel switching control unit enables the system to transition between different testing channels based on test requirements, providing adaptability without requiring all channels to be simultaneously active, thus controlling complexity.
2Adaptability or versatility
If channel switching control is implemented between static and dynamic testing channels, then testing versatility is improved, but control complexity increases
Solution Approach 1:
A channel switching control unit is introduced as an intermediary component between the static and dynamic testing channels. This dedicated control unit manages the switching logic and signal routing, simplifying the overall control architecture while enabling flexible transitions between testing modes.
Solution Approach 2:
The channel switching control unit uses identical circuit structures for both static and dynamic channels (as shown in the embodiments), copying the same switching mechanism to handle both channel types. This standardization reduces control complexity by reusing proven designs rather than creating separate control logic for each channel type.
3Measurement precision
If comprehensive static and dynamic testing is performed, then measurement precision is improved, but testing time increases
Solution Approach 1:
The system performs testing in periodic cycles, alternating between static testing and dynamic testing phases through channel switching. This allows comprehensive performance evaluation to be conducted systematically over time, maintaining measurement precision while organizing the testing process to minimize total duration through efficient phase transitions.
Data Source
AI summary
The present invention discloses an in-situ testing system for semiconductor device in aerospace irradiation environment. The present invention includes a static testing unit, a static testing channel, a dynamic testing unit, a dynamic testing channel, and a channel switching control unit; the static testing unit is connected to the device under test through the static testing channel, and is used to output static testing signals and display the static testing data of the device under test; the dynamic testing unit is connected to the device under test through the dynamic testing channel, and is used to output dynamic testing signals and display the dynamic testing data of the device under test; the channel switching control unit is connected to the static testing channel and the dynamic testing channel, respectively. This invention can achieve static, dynamic, and degradation testing of third-generation semiconductor device in aerospace irradiation environment.