Semiconductor Inspecting Apparatus Data Transmission Flexibility
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Solution Overview
Problem
Existing semiconductor inspecting apparatuses face challenges with fixed parallel bus width and number of serial lanes, limiting flexibility in data transmission systems and increasing development costs and reliability issues due to individualized data transmission apparatuses.
Innovation Solution
A semiconductor inspecting apparatus with a data transmission system that includes equivalent transmission capacity conversion units and inverse conversion units, allowing for arbitrary parallel bus width and serial lane configurations, enabling flexible data transmission and reducing development costs through customizable circuit modules.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If fixed parallel bus width and number of serial lanes are used, then device complexity is reduced, but adaptability deteriorates
Solution Approach 1:
The patent implements a universal data transmission apparatus that can function across multiple transmission systems with different bus widths and transmission capacities. By making the apparatus multi-functional, it can be applied to various data transmission systems within semiconductor inspecting apparatuses without requiring individualized designs for each system, thereby resolving the contradiction between adaptability and device complexity.
Solution Approach 2:
The patent employs dynamic configuration capabilities where the data transmission apparatus can adjust its operation to match different transmission system requirements. This dynamic adaptability allows the same apparatus to be configured for different bus widths and transmission capacities, eliminating the need for multiple fixed-design apparatuses and reducing overall system complexity while maintaining high adaptability.
2Adaptability or versatility
If individualized data transmission apparatuses are developed for each transmission system, then adaptability improves, but manufacturing cost increases
Solution Approach 1:
The patent creates a universal data transmission apparatus that can be manufactured once and deployed across multiple transmission systems. This eliminates the need for individualized development and manufacturing of separate apparatuses for each system, significantly reducing manufacturing costs while maintaining the ability to adapt to different transmission requirements through configurable parameters and standardized interfaces.
3Adaptability or versatility
If individualized data transmission apparatuses are developed for each transmission system, then adaptability improves, but reliability deteriorates
Solution Approach 1:
The patent implements a universal data transmission apparatus with standardized circuit constructions that can be reliably manufactured and deployed across multiple systems. By using a proven, standardized design rather than multiple individualized designs, the apparatus achieves higher reliability through consistent manufacturing processes and validated circuit architectures, while still adapting to different transmission systems through configurable parameters.
Data Source
AI summary
A semiconductor inspecting apparatus includes: a buffer memory whose width is matched to the greater of parallel bus width and the width of the number of serial lanes; a preceding stage bus switching unit that fills the buffer memory with input data without making a free space; equivalent transmission capacity conversion including a following stage bus switching unit that fills read data to the width of an arbitrary number of serial lanes without making a free space; a preceding stage bus switching unit that fills a buffer memory with input data without making a free space; and equivalent transmission capacity inverse conversion including a following stage bus switching unit that fills a parallel bus of arbitrary width with data read from a buffer memory without making a free space.