Semiconductor I/O Timing Control for ECC Write Margin
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Solution Overview
Problem
As semiconductor devices increase data transmission speeds, the probability of error occurrence also rises, necessitating novel design schemes to ensure reliable data transmission, which existing error detection and correction codes struggle to address effectively.
Innovation Solution
A semiconductor device is designed with an I/O control circuit that delays write and read signals to generate enablement and strobe signals, and an error correction circuit that outputs parity information and corrects errors based on these signals, with delay times controlled according to whether an error correction operation is performed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If data transmission speed is increased, then productivity is improved, but error occurrence probability increases
Solution Approach 1:
The patent applies preliminary action by generating and transmitting error detection codes (EDC) and error correction codes (ECC) along with the data before transmission. This allows errors to be detected and corrected in advance, maintaining high transmission speeds while improving reliability through pre-configured error handling mechanisms.
Solution Approach 2:
The patent uses error detection codes and correction codes as intermediary elements that mediate between the transmitted data and the potential errors. These codes act as intermediaries that carry error information without interfering with the primary data transmission, thus maintaining speed while enabling error management.
2Reliability
If error correction operation is performed, then reliability is improved, but timing margin is reduced
Solution Approach 1:
The patent performs preliminary action by preparing and transmitting error correction codes along with the data in advance. The I/O control circuit delays write and read signals to provide sufficient time for error correction operations to complete, ensuring that corrections are ready before data validation occurs, thus maintaining timing margins while enabling error correction.
Solution Approach 2:
The patent applies dynamics by making the delay time of write and read signals controllable based on whether error correction is being performed. The I/O control circuit dynamically adjusts the timing of column signals to match the error correction operation status, optimizing the balance between error correction capability and timing margin utilization.
3Reliability
If write signal delay is increased, then error correction timing is improved, but operation speed is reduced
Solution Approach 1:
The patent applies dynamics by making the write signal delay controllable and variable. The I/O control circuit adjusts the delay time of write signals based on the error correction operation status, providing longer delays when error correction is needed and shorter delays when it is not, thus dynamically optimizing both timing and speed requirements.
Solution Approach 2:
The patent changes the timing parameters of write and read signals dynamically. By adjusting the delay time parameter based on error correction needs, the system can optimize the timing margin for error correction operations without permanently reducing operation speed, as the parameter is adjusted only when necessary.
Data Source
AI summary
A semiconductor device may be provided. The semiconductor device may include an input and output (I/O) circuit configured to output transfer data generated from input data as internal data based on a write enablement signal and configured to output error information on the input data based on the write enablement signal. The generation of the write enablement signal may be based on a write signal which may be delayed by a delay time according to whether an error correction operation is performed.