Semiconductor I/O Impedance Calibration Before Data Driving

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

As semiconductor integration density increases, minimal environmental changes affect circuit operations, leading to impedance mismatch between the transmitting and receiving sides, resulting in signal distortion during normal operation, despite initial impedance settings made during setup.

Innovation Solution

A semiconductor apparatus and system that includes a command generation circuit, impedance setting circuit, and data driving circuit, which perform a hidden calibration operation to reflect reference resistance into impedance settings just before data driving operations, using internal command signals to optimize impedance matching and minimize signal distortion.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If impedance is set during setup operation time, then initial impedance matching is achieved, but impedance mismatch occurs during normal operation due to environmental changes

Engineering Contradiction:
Improveimpedance matchingVSAvoidenvironmental change adaptation
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent performs a hidden calibration operation just before the data driving operation to update impedance settings. This preliminary action ensures that impedance matching is refreshed with current environmental conditions, resolving the contradiction between initial setup matching and adaptation to environmental changes during normal operation.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent introduces dynamic impedance adjustment by performing calibration operations at different timings (setup operation time and hidden calibration operation time). This allows the impedance settings to adapt dynamically to environmental changes, transforming the static impedance setting into a dynamic system that maintains matching reliability.

Inventive Principle:
Principle #15Dynamics

2Reliability

If hidden calibration operation is performed before data driving operation, then impedance matching is optimized, but additional operation time is required

Engineering Contradiction:
Improveimpedance matchingVSAvoidcalibration operation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The hidden calibration operation is performed in advance just before the data driving operation, preparing the impedance settings beforehand. This preliminary action ensures that when the data driving operation starts, the impedance is already optimized, minimizing the impact of calibration time on overall system performance.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent discards the impedance settings from the setup operation time by performing a new calibration operation. The old impedance settings are replaced with updated settings that reflect current environmental conditions, ensuring optimal matching while accepting the temporary loss of time for recalibration.

Inventive Principle:
Principle #34Discarding and recovering

Data Source

PatentUS11855625B2Semiconductor apparatus, semiconductor system, and operating method of semiconductor apparatus
Publication Date: 2023.12.26 SK HYNIX INC
  • US11855625B2 patent drawing
  • US11855625B2 patent drawing
  • US11855625B2 patent drawing

AI summary

A semiconductor apparatus may include: a command generation circuit configured to generate a first internal command signal and a second internal command signal, which are sequentially activated on the basis of a data command signal for a data driving operation; an impedance setting circuit enabled on the basis of the first internal command signal, and configured to set impedance into which a reference resistance is reflected; and a data driving circuit enabled on the basis of the second internal command signal, and configured to perform the data driving operation on the basis of the set impedance.