Semiconductor Latch Data Generation Circuit for Power-Efficient Mode Data
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Solution Overview
Problem
Semiconductor devices face challenges in efficiently managing data operations, particularly in generating and storing mode data during pattern input modes, which affects data integrity and power consumption.
Innovation Solution
Incorporating a latch data generation circuit and a column path circuit that extract and store pattern data, generating latched data when entering a pattern input mode and producing mode data after a write latency, allowing for multiple write operations with varying logic level combinations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If pattern data is extracted and latched during pattern input mode, then data management efficiency is improved, but power consumption increases
Solution Approach 1:
The latch data generation circuit extracts pattern data from external signals and generates latched data in advance during pattern input mode, before actual write operations are needed. This preliminary preparation improves data management efficiency by having data ready when needed, while the circuit only operates during specific pattern input modes rather than continuously, thereby controlling power consumption.
2Reliability
If multiple write commands are processed sequentially during write latency period, then data integrity is improved, but operational speed decreases
Solution Approach 1:
The column path circuit stores latched data and generates mode data after a predetermined write latency period elapses. During this write latency period, the circuit is configured to process only one write command, preventing multiple write commands from being executed simultaneously. This ensures data integrity by allowing proper settling time while maintaining operational speed by automatically readying the circuit for the next command after latency.
3Productivity
If latched data is stored in column path circuit after write latency, then data readiness is improved, but circuit complexity increases
Solution Approach 1:
The latch data generation circuit and column path circuit are integrated to share common functional blocks. The column path circuit stores latched data generated by the latch data generation circuit and processes write commands, merging data preparation and execution functions. This integration improves data readiness by having stored latched data ready for immediate write operations while reducing overall circuit complexity through shared resources and consolidated control logic.
Data Source
AI summary
A semiconductor device includes a latch data generation circuit and a column path circuit. The latch data generation circuit extracts pattern data from external signals and generates latched data from the extracted pattern data, when the semiconductor device enters a pattern input mode. The column path circuit stores the latched data when a write command is inputted in the pattern input mode and generates mode data from the latched data stored in the column path circuit after a write latency elapses from a point of time that the write command is inputted.