Semiconductor Device Latch Signal Circuit for Power and Speed Trade-off
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Solution Overview
Problem
Semiconductor devices in mobile systems face challenges in reducing power consumption and optimizing data transmission speeds, which affects the weight and functionality of portable devices.
Innovation Solution
The semiconductor device incorporates a latch signal generation circuit, a test pulse generation circuit, and a test period signal generation circuit to manage clock signals and enable specific functions, such as training operations, by generating test pulses and period signals synchronized with internal clock signals, allowing for efficient command and address decoding.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Use of energy by moving object
If power consumption of semiconductor devices is reduced, then battery capacity can be reduced and total weight decreases, but data transmission speed may be affected
Solution Approach 1:
The patent implements periodic test operations at predetermined intervals rather than continuous monitoring, allowing the semiconductor device to enter low-power states between tests while maintaining data transmission capability. The training mode is activated periodically to recalibrate signal levels without requiring continuous operation.
Solution Approach 2:
The patent dynamically adjusts signal level parameters during training mode operations to optimize power consumption. By modifying voltage levels and signal characteristics during periodic training, the device achieves efficient power usage while maintaining acceptable data transmission speeds during normal operation.
2Reliability
If test operations are performed frequently to maintain signal integrity, then training mode stability improves, but power consumption increases
Solution Approach 1:
The patent implements periodic test operations at predetermined intervals rather than continuous monitoring, allowing the semiconductor device to enter low-power states between tests while maintaining data transmission capability. The training mode is activated periodically to recalibrate signal levels without requiring continuous operation.
3Speed
If multiple pins are used to simultaneously receive command and address, then data transmission speed improves, but signal decoding complexity increases
Solution Approach 1:
The patent divides the incoming signals on multiple pins into separate command and address components, using dedicated decoder circuits for each type of signal. This segmentation allows simultaneous reception and independent decoding of commands and addresses, maintaining high transmission speed while managing complexity through functional separation.
Solution Approach 2:
The patent introduces command decoder and address decoder circuits as intermediary components that translate the combined pin signals into separate, manageable control signals. These decoder intermediaries simplify the processing logic by pre-processing and categorizing incoming signals before they reach the main control logic.
Data Source
AI summary
A semiconductor device includes a latch signal generation circuit latching an external signal in synchronization with an internal clock signal to generate a latch signal, a test pulse generation circuit buffering the internal clock signal according to the latch signal to generate a test pulse signal, and a test period signal generation circuit generating a test period signal which is enabled, in response to a pulse of the test pulse signal, to execute a predetermined function.