Semiconductor Leakage Detection Without Series Resistance
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Solution Overview
Problem
Existing semiconductor devices face performance degradation due to the need for resistance elements in power current supply paths to detect abnormal leakage current, leading to unnecessary voltage drops and potential system failures.
Innovation Solution
A semiconductor device with an abnormality monitor unit that compares voltage changes at specific nodes between functional modules and power switches when they are off, allowing for the detection of abnormal leakage current without the need for resistance elements in the power supply path.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a resistance element is inserted into the power current supply path to detect abnormal leakage current, then the fault detection capability is improved, but a useless voltage drop is induced during normal operation leading to performance degradation
Solution Approach 1:
The patent extracts the detection function from the power supply path by removing the resistance element insertion approach. Instead, it uses a separate abnormality monitor unit that observes voltage changes at specific nodes without interfering with the normal power flow, thereby eliminating the harmful voltage drop while maintaining detection capability
Solution Approach 2:
The patent introduces an intermediary approach by using voltage change monitoring at nodes between functional modules and power switches as a mediator to detect abnormal leakage current. This intermediary measurement method allows fault detection without directly inserting resistance elements into the power path, avoiding the voltage drop issue
2Reliability
If a resistance element is inserted into the power current supply path to detect abnormal leakage current, then the fault detection capability is improved, but the device complexity increases due to additional components
Solution Approach 1:
The abnormality monitor unit is designed to perform multiple functions: it monitors voltage changes at different nodes, detects abnormal leakage current, and can identify which specific functional module has the abnormality. This multi-functionality reduces the need for separate dedicated components for each detection task, thereby reducing overall device complexity
Solution Approach 2:
The patent employs a self-service approach where the existing voltage nodes and power switches in the circuit are utilized for detection purposes. The abnormality monitor unit leverages the existing circuit structure and voltage changes that naturally occur during operation, rather than requiring entirely separate detection circuits, thus minimizing additional complexity
Data Source
AI summary
In a semiconductor device, an abnormality monitor unit detects whether abnormal leakage current has been generated from a first functional module or a second functional module on the basis of a comparison between a change in voltage at a first node between the first functional module and a first power switch when the first power switch is in an off state and a change in voltage at a second node between the second functional module and a second power switch when the second power switch is in the off state.