Semiconductor Leakage Current Circuit With Timed Detection Window
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Solution Overview
Problem
Existing leakage current detection circuits in semiconductor elements fail to effectively separate the duration of charging current from discharging current, making it difficult to accurately detect leakage currents between a drain and a gate or between a gate and a source in power devices like MOSFETs.
Innovation Solution
A leakage current detection circuit comprising a setting circuit and a detector, where the setting circuit sets an undetectable duration for either charging or discharging current, allowing the detector to output a signal only when leakage current flows after this duration has elapsed, thereby isolating and detecting the leakage current.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the detection circuit monitors current continuously, then it can detect leakage current, but it cannot distinguish between charging current and leakage current
Solution Approach 1:
The patent segments the detection process by dividing it into distinct time periods: a first period during which charging current flows and a second period during which leakage current is detected. This temporal segmentation allows the circuit to distinguish between different current types by monitoring them in separate time windows, thereby achieving both continuous monitoring and accurate discrimination.
2Productivity
If the detection circuit operates during the charging current period, then it can monitor current flow, but it cannot accurately detect leakage current due to interference from charging current
Solution Approach 1:
The patent applies preliminary action by completing the charging current flow in a first period before initiating the leakage current detection in a second period. This sequential arrangement ensures that charging current has fully established and ceased before the detection phase begins, eliminating interference and enabling accurate leakage current measurement without compromising detection coverage.
Data Source
AI summary
A circuit for detecting a leakage current in a semiconductor element includes a setting circuit and a detector. The semiconductor element includes a first terminal at a high-potential-side of the semiconductor element, a second terminal at a low-potential-side of the semiconductor element, and a control terminal. The control terminal receives a signal for controlling a conduction state between the first terminal and the second terminal. The setting circuit sets a duration during which a charging current flows to the control terminal as an undetectable duration, in response to turning on the semiconductor element. The detector outputs a detected signal based on a condition that the leakage current flowing from the control terminal to the second terminal, after the undetectable duration has been elapsed.