Semiconductor Logic Verification via Divisional Memory Model

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Solution Overview

Problem

The existing methods for verifying logic equivalence in semiconductor integrated circuits, especially after sub-banking of memory, are inefficient due to the lengthy process of logic simulation and subsequent design operations, making it impractical to perform sub-banking after logic simulation.

Innovation Solution

A verification apparatus and method that uses a divisional memory model for formal verification, treating the memory as a black box and verifying logic equivalence before and after modification by replacing the memory with a model that matches in input and output pins, reducing the time required for logic verification.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If logic simulation is performed for logic verification after sub-banking of memory, then logic equivalence can be verified, but verification time becomes excessively long

Engineering Contradiction:
Improvelogic equivalence verificationVSAvoidverification time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent creates a copy of the memory circuit at the RTL level to serve as a reference model for formal verification. This copy is used to generate expected behavior patterns that are then compared against the gate-level netlist, eliminating the need for time-consuming logic simulation while maintaining verification reliability

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent replaces the mechanical logic simulation process with a formal verification method that uses symbolic representation and mathematical proof. Instead of simulating each clock cycle, the system uses formal methods to mathematically prove equivalence between RTL and gate-level designs, dramatically reducing verification time

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If gate level simulation is performed for large-scale integrated circuit, then detailed verification is achieved, but simulation time becomes impractically long

Engineering Contradiction:
Improveverification detailVSAvoidsimulation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent extracts the essential verification function from the gate-level netlist by creating an RTL-level copy that captures only the critical behavioral characteristics. This extracted model is sufficient for equivalence verification and eliminates the computational burden of simulating every gate-level detail

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent segments the verification process into two distinct phases: first, generating expected patterns from the RTL copy; second, comparing these patterns against gate-level simulation results. This segmentation allows the system to use the more efficient RTL model for the majority of verification work while still achieving detailed gate-level verification where necessary

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS9069921B2Verification apparatus for semiconductor integrated circuit, verification method for semiconductor integrated circuit, and program therefor
Publication Date: 2015.06.30 KK TOSHIBA
  • US9069921B2 patent drawing
  • US9069921B2 patent drawing
  • US9069921B2 patent drawing

AI summary

The verification apparatus for a semiconductor integrated circuit verifies a logic equivalence before and after modification to the circuit by replacing a memory with a divisional memory model that agrees with the memory in number of input and output pins and verifying logics at an input and an output thereof.