Semiconductor Memory Device Insulating Pillars

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Solution Overview

Problem

Existing semiconductor memory devices face challenges in preventing structure collapse during the manufacturing process, particularly when forming high-aspect-ratio memory trenches, which can lead to layer stack buckling and reduced device reliability.

Innovation Solution

Incorporating insulating pillars between semiconductor layers and word line pillars, arranged at specific distances and pitches, to support the layer stack and prevent collapse, while also simplifying the manufacturing process by using the same process for both memory cell and select gate contact regions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If high-aspect-ratio memory trenches are formed to increase storage density, then storage capacity is improved, but structure collapse and layer stack buckling occur during manufacturing

Engineering Contradiction:
Improvestorage densityVSAvoidstructure stability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent divides the continuous layer stack into discrete segments by inserting insulating pillars at regular intervals between the semiconductor layers and word line pillars. This segmentation prevents the continuous structure from collapsing by creating independent supported sections, allowing high-aspect-ratio memory trenches to be formed without compromising overall structure stability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Insulating pillars are introduced as intermediary elements between the semiconductor layers and word line pillars. These pillars act as mechanical support structures that prevent direct contact and potential collapse between the layered components, maintaining structural integrity during the formation of high-aspect-ratio memory trenches.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If insulating pillars are added to support the layer stack, then structure stability is improved, but device complexity increases

Engineering Contradiction:
Improvestructure stabilityVSAvoidnumber of components
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the formation of insulating pillars with the existing manufacturing process for forming memory cell contact regions. By using the same etching and filling processes for both memory cell contacts and insulating pillars, the patent avoids adding separate processing steps, thereby maintaining manufacturing simplicity while achieving structural support.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The insulating pillars serve multiple functions: they provide mechanical support to prevent layer stack collapse, act as spacers to maintain proper spacing between components, and are formed using the same process that creates memory cell contacts. This multi-functionality reduces the need for additional specialized components or processes.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20230014439A1Semiconductor memory device
Publication Date: 2023.01.19 KIOXIA CORP
  • US20230014439A1 patent drawing
  • US20230014439A1 patent drawing
  • US20230014439A1 patent drawing

AI summary

According to one embodiment, a semiconductor memory device includes the following structure. First and second semiconductor layers extend in a first direction. The second semiconductor layer is stacked apart from the first semiconductor layer in a second direction. First, second and third conductive layers and a first insulating layer extend in the second direction and intersect the first and second semiconductor layers. The first insulating layer is provided at a first distance from the first conductive layer in the first direction. The second conductive layer is provided at the first distance from the first insulating layer in the first direction. The third conductive layer is provided at the first distance from the second conductive layer in the first direction.