Semiconductor Memory Device Serial Parallel I/O Switching
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Solution Overview
Problem
Conventional semiconductor memory devices face challenges in supporting high-speed serial data communication and efficient testing due to limitations in their I/O interfaces, particularly when transitioning between parallel and serial interfaces, which increases testing time and hardware costs.
Innovation Solution
A semiconductor memory device with multiple ports and banks that can switch between serial and parallel data communication modes using a test mode controller, mode setting unit, and clock generating unit to support various data transfer rates, enabling efficient core testing in a parallel I/O interface.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a parallel I/O interface is used for high-speed data transfer, then data processing efficiency is improved, but the number of buses increases leading to higher product cost
Solution Approach 1:
The patent implements a multi-port memory device where each port can independently operate in either parallel or serial I/O mode dynamically. The device includes multiple ports (PORT0 to PORT3) with configurable I/O interfaces that can switch between parallel and serial modes based on operational requirements, allowing optimal performance for different applications without fixed constraints
Solution Approach 2:
The memory device provides universal functionality by supporting both parallel and serial I/O interfaces across multiple ports. Each port can be configured to handle different data transfer modes, making the device adaptable to various application scenarios including high-speed parallel communication and long-distance serial communication, thereby reducing the need for multiple specialized devices
2Device complexity
If a single port memory device is used, then hardware configuration is simplified, but multiple functions cannot operate simultaneously and compatibility with serial interface devices is limited
Solution Approach 1:
The memory device is segmented into multiple independent ports (PORT0 to PORT3), each capable of operating autonomously with its own I/O interface. This segmentation allows different ports to handle different functions simultaneously and interface with different types of external devices independently, enhancing versatility while maintaining manageable complexity through modular architecture
Solution Approach 2:
Each port's I/O interface is dynamically configurable between parallel and serial modes, allowing the device to adapt to different external devices and application requirements. This dynamic capability enables the same hardware to support both traditional parallel interfaces and modern serial interfaces without requiring separate dedicated hardware for each interface type
3Device complexity
If a serial I/O interface is used for long-distance transmission, then product cost is reduced, but data processing efficiency decreases
Solution Approach 1:
The device allows dynamic selection between serial and parallel I/O modes for each port based on transmission distance and speed requirements. For short-distance high-speed applications, parallel mode provides excellent data processing efficiency, while for long-distance transmissions, serial mode reduces product cost, enabling optimal trade-off for each specific application scenario
4Adaptability or versatility
If testing is performed in serial I/O mode for multi-port memory devices, then compatibility with external test devices is improved, but testing time increases significantly
Solution Approach 1:
The test mode controller dynamically switches the I/O interface between serial and parallel modes during different phases of testing. Serial mode is used for initial configuration and compatibility-based testing, while parallel mode is utilized for high-speed data transfer testing, thereby reducing overall testing time while maintaining compatibility requirements
Solution Approach 2:
The device performs preliminary configuration and setup operations in serial I/O mode to ensure compatibility with external test devices, then transitions to parallel I/O mode for the actual high-speed data transfer testing. This preliminary action in serial mode prevents compatibility issues while the subsequent parallel mode operation minimizes testing time for performance evaluation
Data Source
AI summary
A semiconductor device includes a plurality of first pads; a plurality of ports for performing a serial data communication with external devices through the first pads; a plurality of banks for performing a parallel data communication with the plurality of ports; a plurality of global data buses for supporting the parallel data communication between the plurality of ports and the plurality of banks; and a test mode controller for performing a core test with various data transfer modes by converting the serial data communication into the parallel data communication during a core test mode.