3D Semiconductor Memory Stack With Segmented Conductive Pattern Formation

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Solution Overview

Problem

The manufacturing process of three-dimensional semiconductor memory devices is complex and requires innovative solutions to simplify the integration of memory cells and conductive patterns, while maintaining device performance.

Innovation Solution

A semiconductor device design featuring alternately stacked interlayer insulating layers and conductive patterns, with channel structures and conductive patterns arranged in a specific configuration to reduce manufacturing complexity, including the use of sacrificial layers and etching processes to form separated conductive patterns and vertical structures.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If memory cells are arranged in three dimensions on a substrate, then integration density is improved, but manufacturing process complexity increases

Engineering Contradiction:
Improveintegration densityVSAvoidmanufacturing process complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The manufacturing process is divided into distinct stages: forming first stack structures with first conductive patterns, then forming second stack structures with second conductive patterns. This segmentation allows each stage to be optimized independently, reducing overall manufacturing complexity while achieving high integration density through vertical stacking

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from planar two-dimensional arrangements to three-dimensional vertical stacking of memory cells. Multiple layers of conductive patterns and insulating layers are stacked in the vertical direction, enabling significantly higher integration density without proportionally increasing manufacturing complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If conductive patterns and channel structures are integrated in three dimensions, then device performance is improved, but manufacturing difficulty increases

Engineering Contradiction:
Improvedevice performanceVSAvoidmanufacturing difficulty
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The first stack structures with first conductive patterns and first channel structures are formed completely before forming the second stack structures. This preliminary action allows each stacking stage to be completed and verified independently, reducing manufacturing difficulty while maintaining device performance

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

Interlayer insulating layers serve as intermediaries between conductive patterns and channel structures, enabling independent formation and integration of these components. The insulating layers facilitate the manufacturing process by providing isolation and structural support during the multi-stage fabrication process

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS11925021B2Semiconductor device and manufacturing method of the semiconductor device
Publication Date: 2024.03.05 SK HYNIX INC
  • US11925021B2 patent drawing
  • US11925021B2 patent drawing
  • US11925021B2 patent drawing

AI summary

A semiconductor device, and method of manufacturing a semiconductor device, includes second conductive patterns separated from each other above a first stack structure which is penetrated by first channel structures and enclosing second channel structures coupled to the first channel structures, respectively. Each of the second conductive patterns includes electrode portions stacked in a first direction and at least one connecting portion extending in the first direction to be coupled to the electrode portions.