3D Semiconductor Memory Device Vertical Channel Pillars

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Solution Overview

Problem

The demand for high integration in semiconductor memory devices is limited by the constraints of photolithography processes, making it challenging to further reduce the minimum line width of fine patterns, which hinders the increase in memory cell density.

Innovation Solution

A semiconductor memory device with a three-dimensional structure is developed, featuring wordline and bitline transistors with channel pillars penetrating the gates, local and global wordlines and bitlines, and variable resistors at intersections, allowing for high integration and efficient memory cell arrangement.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the minimum line width of fine patterns is shortened to increase memory cell density, then integration level is improved, but photolithography process limits are reached making further shortening difficult

Engineering Contradiction:
Improvememory cell densityVSAvoidminimum line width
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

The patent transitions from two-dimensional planar transistors to three-dimensional vertical channel transistors. The channel extends vertically through the substrate thickness rather than laterally, allowing memory cell density to increase by utilizing the third dimension (depth) instead of further reducing the minimum line width in the planar direction. This dimensional change bypasses photolithography process limits.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If three-dimensional vertical channel transistors are used to increase integration, then memory cell density is improved, but device complexity increases

Engineering Contradiction:
Improvememory cell densityVSAvoidthree-dimensional structure
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The memory device is divided into multiple stacked memory cell layers, with each layer containing complete wordline and bitline transistor sets. This segmentation allows the complex three-dimensional structure to be organized into manageable, repeating units, simplifying the overall device architecture while maintaining high density.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The vertical channel transistors serve multiple functions: they act as both wordline transistors and bitline transistors depending on which gate electrode controls them. This multi-functionality reduces the total number of transistor components needed, thereby reducing device complexity while maintaining high memory cell density.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS8264018B2Semiconductor memory device
Publication Date: 2012.09.11 SAMSUNG ELECTRONICS CO LTD
  • US8264018B2 patent drawing
  • US8264018B2 patent drawing
  • US8264018B2 patent drawing

AI summary

Provided is a semiconductor memory device. The semiconductor memory device may include a local bitline extending in a direction substantially vertical to an upper surface of a semiconductor substrate and a local wordline intersecting the local bitline. The local bitline is electrically connected to a bitline channel pillar penetrating a gate of a bitline transistor, and the local wordline is electrically connected to a wordline channel pillar penetrating a gate of a wordline transistor.