Semiconductor Light Extraction via Metallic Plasma Conversion

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Solution Overview

Problem

Conventional semiconductor structures used for light sources, such as those made from gallium nitride, suffer from low light extraction efficiency due to near-field evanescent waves being internally reflected, leading to a significant portion of emitted light being trapped within the structure.

Innovation Solution

The semiconductor structure incorporates a metallic layer as an optical symmetric center, with refractive index-matched layers and three-dimensional nano-structures to amplify and scatter near-field evanescent waves, enhancing light extraction efficiency by converting them into metallic plasma and uniformly distributing it across the structure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Use of energy by moving object

If a conventional semiconductor structure is used with N-type and P-type layers, then the device can emit visible light through electron-hole recombination, but the light extraction efficiency is degraded due to internal reflection of near-field evanescent waves

Engineering Contradiction:
Improvelight extraction efficiencyVSAvoidtrapped light energy
Core Design Contradiction:
Use of energy by moving objectVSLoss of energy

Solution Approach 1:

The patent converts the harmful near-field evanescent waves that are normally internally reflected and trapped into useful extracted light by introducing a metallic layer that transforms them into metallic plasma, which then radiates light outward, turning the previously harmful trapped energy into beneficial light output

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The patent changes the optical parameters of the semiconductor structure by introducing a metallic layer with specific refractive index properties and creating three-dimensional nano-structures, which modifies the refractive index distribution and enables transformation of evanescent waves into propagating light modes

Inventive Principle:
Principle #35Parameter changes

2Use of energy by moving object

If refractive index-matched layers are added to improve light extraction, then the light extraction efficiency increases, but the device structure becomes more complex

Engineering Contradiction:
Improvelight extraction efficiencyVSAvoidstructure complexity
Core Design Contradiction:
Use of energy by moving objectVSDevice complexity

Solution Approach 1:

The patent creates a composite structure combining semiconductor layers with a metallic layer and three-dimensional nano-structures, where the metallic component provides unique plasma oscillation properties that cannot be achieved with conventional dielectric materials alone, enabling enhanced light extraction through a different physical mechanism

Inventive Principle:
Principle #40Composite materials

3Use of energy by moving object

If three-dimensional nano-structures are introduced to amplify and scatter evanescent waves, then light extraction efficiency is enhanced, but the manufacturing process becomes more difficult

Engineering Contradiction:
Improvelight extraction efficiencyVSAvoidmanufacturing difficulty
Core Design Contradiction:
Use of energy by moving objectVSEase of manufacture

Solution Approach 1:

The patent transitions from two-dimensional planar semiconductor layers to three-dimensional nano-structures with vertical and lateral features, adding a third dimension to the structure that enables scattering and amplification of evanescent waves through multiple interfaces and paths, thereby enhancing light extraction efficiency

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration significantly increases light extraction efficiency by uniformly distributing metallic plasma and increasing the electron-hole recombination density, leading to improved luminous efficiency and light output.

Implementation Method 1

near field evanescent waves emitted from the active layer are internally reflected inside the semiconductor structure

Methodology Applied
Scientific EffectNear-field evanescent waves:

Implementation Method 2

amplify and scatter near-field evanescent waves, enhancing light extraction efficiency by converting them into metallic plasma

Methodology Applied
Scientific EffectMetallic plasma: Plasma

Implementation Method 3

refractive index-matched layers and three-dimensional nano-structures to amplify and scatter near-field evanescent waves

Methodology Applied
Scientific EffectRefraction: Refraction

Implementation Method 4

near field evanescent waves emitted from the active layer are internally reflected inside the semiconductor structure

Methodology Applied
Scientific EffectTotal internal reflection: Total Internal Reflection

Implementation Method 5

amplify and scatter near-field evanescent waves

Methodology Applied
Scientific EffectScattering: Scattering

Implementation Method 6

three-dimensional nano-structures to amplify and scatter near-field evanescent waves

Methodology Applied
Scientific EffectDiffraction: Diffraction

Implementation Method 7

holes in the P-type semiconductor layer and electrons in the N-type semiconductor layer can enter the active layer and combine with each other to emit visible light

Methodology Applied
Scientific EffectElectroluminescence: Electroluminescence

Data Source

PatentUS8803176B2Semiconductor structure
Publication Date: 2014.08.12 HON HAI PRECISION INDUSTRY CO LTD
  • US8803176B2 patent drawing
  • US8803176B2 patent drawing
  • US8803176B2 patent drawing

AI summary

A semiconductor structure includes a first semiconductor layer, a active layer, a second semiconductor layer, a third optical symmetric layer, a metallic layer, a fourth optical symmetric layer, and a first optical symmetric layer stacked in sequence. The first semiconductor layer, the active layer, and the second semiconductor layer constitute a source layer. A refractive index of the third optical symmetric layer or the fourth optical symmetric layer is in a range from about 1.2 to about 1.5. A refractive index difference between the source layer and the first optical symmetric layer is less than or equal to 0.3.