Semiconductor Package Misaligned Pads Prevent Solder Sweeping
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current semiconductor packages face challenges in achieving high reliability due to the solder sweeping phenomenon during thermal compression bonding, which can lead to short circuits and contact failures, especially in the peripheral regions where pads are aligned with TSVs and bumps.
Innovation Solution
The semiconductor package design includes misaligned pads and bumps with respect to TSVs, where the pads in the peripheral region are offset from the centerline of the corresponding TSVs and bumps, allowing for sufficient accommodation of the solder layer's fluidity and reducing the risk of short circuits through asymmetrical pad design and appropriate misalignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If pads are aligned with TSVs and bumps in peripheral regions, then manufacturing precision is improved, but reliability deteriorates due to solder sweeping phenomenon causing short circuits
Solution Approach 1:
The pad structure is designed with asymmetry by extending the pad beyond the centerline of the TSV in the radial direction. This asymmetric configuration allows the pad to accommodate the solder layer's fluidity during thermal compression bonding, preventing the solder from sweeping to adjacent regions and causing short circuits, thus resolving the contradiction between alignment precision and bonding reliability
Solution Approach 2:
The pad is designed with different geometries in different regions: the pad extends beyond the TSV centerline in the radial direction to accommodate solder fluidity, while maintaining proper alignment in other directions. This local quality variation allows the pad to serve multiple functions - precise alignment and solder accommodation - simultaneously resolving the contradiction
2Reliability
If pads are offset from TSV centerlines to accommodate solder fluidity, then reliability is improved, but manufacturing precision deteriorates due to misalignment
Solution Approach 1:
The pad structure is designed with asymmetry by extending the pad beyond the centerline of the TSV in the radial direction. This asymmetric configuration allows the pad to accommodate the solder layer's fluidity during thermal compression bonding, preventing the solder from sweeping to adjacent regions and causing short circuits, thus resolving the contradiction between alignment precision and bonding reliability
Solution Approach 2:
The pad is designed with different geometries in different regions: the pad extends beyond the TSV centerline in the radial direction to accommodate solder fluidity, while maintaining proper alignment in other directions. This local quality variation allows the pad to serve multiple functions - precise alignment and solder accommodation - simultaneously resolving the contradiction
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design enhances the reliability of the semiconductor package by preventing short circuits and contact failures, maintaining robust bonding despite the solder sweeping phenomenon, and optimizing the bonding force between pads and bumps.
Implementation Method 1
allowing for sufficient accommodation of the solder layer's fluidity
Data Source
AI summary
A semiconductor package includes a lower chip, an upper chip on the lower chip, and an adhesive layer between the lower chip and the upper chip. The lower chip has first through silicon vias (TSVs) and pads on an upper surface thereof. The pads are connected to the first TSVs, respectively. The upper chip includes bumps on a lower surface thereof. The bumps are bonded to the pads. Vertical centerlines of the bumps are aligned with vertical centerlines of the first TSVs, respectively. The vertical centerlines of the bumps are offset from the vertical centerlines of the pads, respectively, in a peripheral region of the lower chip.


