Semiconductor Device High Priority Module Coupling State Check
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Solution Overview
Problem
Existing semiconductor systems fail to quickly detect malfunctions in high priority modules due to infrequent checks of their coupling state with the communication bus, especially when coexisting with low priority modules.
Innovation Solution
A semiconductor device and method that includes a communication circuit for data communication with modules, a check circuit to monitor response from selected high priority modules based on a check list, and a control circuit to selectively operate the communication and check circuits, ensuring frequent checks of high priority modules.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If periodic checking of all modules is performed, then system reliability is improved, but detection speed of high priority module malfunctions deteriorates
Solution Approach 1:
The patent applies local quality by differentiating check frequencies for different modules based on their priority levels. High priority modules are checked more frequently than low priority modules, allowing the system to maintain high reliability for critical components while improving detection speed for important malfunctions without unnecessarily checking all modules at maximum frequency.
Solution Approach 2:
The patent implements dynamic checking intervals where the check frequency is adjusted according to module priority. The control circuit dynamically selects which modules to check and at what frequency, enabling faster detection of high priority module malfunctions while maintaining overall system reliability through periodic checks of all modules.
2Speed
If checking frequency for all modules is increased, then detection speed is improved, but processing time and system complexity worsen
Solution Approach 1:
The patent applies local quality by concentrating checking resources on high priority modules rather than uniformly increasing check frequency for all modules. This allows fast detection of critical malfunctions while minimizing processing time waste on non-critical components.
Solution Approach 2:
The patent implements partial action by performing frequent checks only on high priority modules and less frequent checks on low priority modules. This selective approach improves detection speed for critical components without the processing time penalty of checking all modules at high frequency.
3Reliability
If sequential checking of all modules is performed, then comprehensive monitoring is achieved, but detection speed of specific high priority modules deteriorates
Solution Approach 1:
The patent applies local quality by creating different monitoring levels for different modules. High priority modules receive intensive monitoring with frequent checks, while low priority modules receive standard periodic monitoring. This ensures comprehensive monitoring coverage while achieving fast detection for critical modules.
Solution Approach 2:
The patent segments the module monitoring into different groups based on priority. The check circuit is configured to selectively check high priority modules more frequently, dividing the monitoring task into segments with different frequencies, thereby maintaining comprehensive coverage while improving detection speed for important modules.
Data Source
AI summary
A semiconductor device is provided which can quickly detect a malfunction of high priority modules by frequently checking a coupling state between the high priority modules and a communication bus.According to an embodiment, a host controller includes a module control circuit that performs data communication with a plurality of externally-provided modules through a communication bus, a coupling state check circuit which is coupled to the communication bus and which checks the presence or absence of a response from the modules, and selected from the modules based on information of a check list, and a control circuit that selectively causes the module control circuit and the coupling state check circuit to operate.