Semiconductor Module Degradation Detection Circuit
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Solution Overview
Problem
Conventional power systems lack a circuit for immediate diagnosis of semiconductor switch degradation, leading to delayed detection of possible degradation.
Innovation Solution
A semiconductor module is introduced, featuring a voltage applying device that applies a voltage equal to or higher than the rated voltage to the semiconductor switch when the apparatus is not in use, along with a leak detecting circuit to detect leak current, enabling immediate detection of degradation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a voltage applying device applies a first voltage equal to or higher than the rated voltage to the semiconductor switch in off-state when the apparatus is not in practical use, then the detection reliability of semiconductor switch degradation is improved, but the device complexity increases due to adding voltage applying device and leak detecting circuit
Solution Approach 1:
The voltage applying device utilizes the existing rated voltage of the apparatus (designed for practical use) and repurposes it for degradation detection when the apparatus is not in practical use. The leak detecting circuit leverages existing circuit structures to detect degradation, making the detection function integrated into the existing system rather than requiring entirely separate dedicated components.
Solution Approach 2:
The system performs degradation detection by applying voltage to the semiconductor switch in off-state before actual degradation causes failure during practical use. This preliminary detection action allows identification of potential issues before they affect operational reliability, enabling preventive maintenance.
2Speed
If leak current is detected by applying voltage equal to or higher than rated voltage to semiconductor switch in off-state when apparatus is not in practical use, then the speed of degradation detection is improved, but the loss of time during practical use increases due to voltage application and detection processes
Solution Approach 1:
The degradation detection is performed periodically when the apparatus is not in practical use, utilizing idle time intervals. This periodic action allows fast detection to occur during natural downtime without interfering with continuous operational requirements, converting potential loss of time into productive detection opportunities.
Solution Approach 2:
Detection is performed in advance during non-practical use periods before the apparatus needs to be operational, ensuring that any degradation is identified before it impacts practical use. This preliminary detection eliminates the need for time-consuming diagnostics during operational periods.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for reliable detection of semiconductor switch degradation by applying a higher voltage during off-state conditions, preventing damage and ensuring timely identification of potential issues.
Implementation Method 1
a voltage applying device configured to apply a first voltage that is equal to or higher than a rated voltage of the apparatus to the semiconductor switch in an off-state
Implementation Method 2
a leak detecting circuit configured to detect a leak current from the semiconductor switch
Data Source
AI summary
A semiconductor module is provided in a power system of an apparatus. The semiconductor module includes a semiconductor switch, a voltage applying device configured to apply a first voltage that is equal to or higher than a rated voltage of the apparatus to the semiconductor switch in an off-state in a case where the apparatus is not in practical use, and a leak detecting circuit configured to detect a leak current from the semiconductor switch. The rated voltage of the apparatus is a rated voltage when the apparatus is in practical use.