Semiconductor Module Life Prediction via Segmented Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional methods for predicting the life of semiconductor modules in elevator drive systems are inaccurate due to measurement circuit disturbances, leading to unreliable life prediction.
Innovation Solution
A semiconductor module with integrated measurement circuits and memory for storing initial and measured characteristic values, allowing for precise life prediction by comparing these values against predetermined determination values, and utilizing a Micro Controller Unit (MCU) to assess characteristic degradation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the inverter device is connected to the elevator control device via a measurement circuit, then the life of the circuit element can be determined, but measurement accuracy is lowered due to disturbances
Solution Approach 1:
The patent divides the measurement function into two separate locations: the measurement circuit in the inverter device for collecting raw voltage data, and the determination circuit in the elevator control device for processing and analyzing the data. This segmentation isolates the measurement process from the control logic, reducing interference and improving both measurement accuracy and life prediction reliability.
Solution Approach 2:
The patent introduces a communication interface as an intermediary between the measurement circuit and the determination circuit. This intermediary transfers measurement data without direct electrical connection, minimizing disturbance effects while maintaining data integrity for accurate life prediction.
2Reliability
If a measurement circuit is used to determine circuit element life, then life prediction can be achieved, but prediction accuracy is insufficient due to disturbances
Solution Approach 1:
The elevator control device is designed to perform multiple functions: it controls the elevator operation and simultaneously determines the life of circuit elements through the determination circuit. This multi-functionality eliminates the need for separate dedicated life prediction equipment, maintaining prediction accuracy while avoiding additional system complexity.
3Measurement precision
If conventional measurement methods are used, then life prediction is possible, but the prediction is not precise
Solution Approach 1:
The patent extracts the determination function from the measurement process itself. The measurement circuit collects voltage data without attempting to determine life directly, while the separate determination circuit performs the life prediction analysis. This extraction removes the harmful interaction between measurement and determination operations, improving measurement precision and eliminating disturbances.
Data Source
AI summary
An object of the invention is to provide the semiconductor module which can predict a life precisely, and the life prediction system for the semiconductor module. The semiconductor module according to the present invention includes IGBTs, diodes, measurement circuits for measuring characteristics of the IGBTs and the diodes, and a memory for storing initial values of predetermined characteristics of the IGBTs and the diodes, measured values of characteristics of the IGBTs and the diodes measured by measurement circuits, and a predetermined determination value for characteristic degradation of the IGBTs and the diodes.