Semiconductor Soft Error Neutron Dosimetry
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional active neutron dosimetry devices are unsuitable for measuring neutrons generated in radiotherapy treatment rooms due to high energy x-ray leakage and intense pulsed photon fluences, leading to inaccurate neutron dose determinations, while passive detectors require significant time and effort for analysis.
Innovation Solution
A system that emits a treatment beam towards a semiconductor-based device to determine soft errors caused by neutrons, allowing for the calculation of neutron doses based on the association between beam energy, soft errors, and neutron doses, using semiconductor-based devices and passive neutron detectors within the treatment room.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional active neutron dosimetry devices are used to measure neutrons in treatment rooms, then neutron dose measurement capability is provided, but measurement precision deteriorates due to high energy x-ray leakage and intense pulsed photon fluences
Solution Approach 1:
The patent extracts the neutron detection function from conventional active dosimetry devices and implements it using a semiconductor-based device that is specifically designed to detect neutrons while being immune to interference from high energy x-rays and pulsed photon fluences. This extraction allows the system to measure neutron dose accurately in the presence of harmful radiation fields that would otherwise distort measurements.
Solution Approach 2:
The patent changes the detection parameter from conventional dosimetry methods to soft error counting in a semiconductor-based device. By monitoring soft errors (bit flips) in the semiconductor device, the system indirectly measures neutron fluence with high precision, transforming the measurement approach to one that is not affected by x-ray leakage or photon fluence interference.
2Measurement precision
If passive detectors are used to detect neutrons in treatment rooms, then measurement precision is maintained, but analysis time increases significantly
Solution Approach 1:
The patent replaces the mechanical/chemical analysis process of passive detectors with an electronic detection system. The semiconductor-based device provides real-time electronic signals that can be processed and analyzed immediately, eliminating the need for time-consuming laboratory analysis of passive detector materials while maintaining measurement precision.
Solution Approach 2:
The semiconductor-based device performs self-diagnosis through soft error counting, automatically detecting neutron exposure without requiring external analysis. The device monitors its own operational errors caused by neutron interactions, providing immediate self-quantification of neutron dose without human intervention or complex analysis procedures.
3Reliability
If active counters are placed outside treatment rooms to avoid radiation interference, then device reliability is improved, but measurement capability deteriorates due to weak relationship between external neutron fluence and internal neutron dose
Solution Approach 1:
The patent introduces a semiconductor-based device as an intermediary that directly measures neutron fluence at the treatment room location. This intermediary device converts neutron exposure into soft error counts, providing a reliable and accurate measurement that directly reflects the neutron dose conditions within the treatment room, eliminating the need for external placement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and accurate determination of neutron doses within the treatment room, reducing the time and effort required for analysis and improving the monitoring and verification of radiotherapy processes.
Implementation Method 1
determine a number of soft errors experienced by a semiconductor-based device exposed to neutrons generated by the treatment beam
Data Source
AI summary
A system includes emission of a first treatment beam associated with a first energy toward a neutron dose detector, determination of a first number of soft errors experienced by a semiconductor-based device exposed to neutrons generated by the first treatment beam, determination of a first neutron dose based on the first treatment beam using the neutron dose detector, and association of the first energy of the first treatment beam with the first number of soft errors and the first neutron dose. Some aspects include emission of a second treatment beam associated with the first energy toward a target, determination of a second number of soft errors experienced by the semiconductor-based device exposed to neutrons generated by the second treatment beam, and determination of a second neutron dose at the target based on the association between the first energy, the first number of soft errors and the first neutron dose.