Semiconductor Device Offset Calibration Using Opposite Phase Clock Signals
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Solution Overview
Problem
Semiconductor devices face challenges in accurately processing small amplitude data signals due to offset issues caused by process skew or transistor mismatch in sampler circuits, which complicates offset calibration and affects signal detection.
Innovation Solution
A semiconductor device is designed with multiple sampler circuits that receive offset clock signals and divided clock signals, and a calibration circuit that applies opposite phase offset clock signals to sampler circuits to generate offset adjustment signals, effectively canceling kick-back noise and ensuring accurate offset voltage application.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If offset calibration is performed using a single clock signal, then the calibration process is simple, but kick-back noise cannot be canceled and measurement precision deteriorates
Solution Approach 1:
The calibration process is segmented into multiple phases where different clock signals (first clock signal and second clock signal with opposite phase) are applied to different sampler circuits. This segmentation allows kick-back noise to be isolated and canceled by comparing calibration results from circuits receiving opposite-phase clock signals, thereby improving measurement precision without excessive complexity increase.
Solution Approach 2:
A dedicated calibration circuit acts as an intermediary to manage the complex calibration process. This calibration circuit applies different clock signals to different sampler circuits, collects calibration data, and performs the offset calculation using the differential approach. The intermediary handles the complexity internally while presenting a simplified interface for offset calibration.
2Measurement precision
If multiple sampler circuits are used with opposite phase clock signals, then kick-back noise is canceled and measurement precision improves, but device complexity increases
Solution Approach 1:
Multiple sampler circuits are merged into a unified calibration framework where they share common control logic and data processing paths. The circuits receiving opposite-phase clock signals are combined in the calibration process, allowing kick-back noise cancellation through differential measurement while sharing hardware resources and reducing overall system complexity.
Solution Approach 2:
The calibration process incorporates feedback mechanisms where the calibration circuit monitors the output of sampler circuits and adjusts offset compensation accordingly. The feedback loop uses the differential calibration results from opposite-phase clock signals to automatically cancel kick-back noise effects, improving measurement precision through iterative refinement without requiring complex manual adjustment.
Data Source
AI summary
A semiconductor device according to an embodiment includes a plurality of sampler circuits configured to receive a plurality of offset clock signals or a plurality of divided clock signals and to sample a data signal in response to each of a plurality of divided clock signals. A calibration circuit applies a first offset clock signal to a first sampler circuit, applies a second offset clock signal having an opposite phase to the first offset clock signal to a second sampler circuit, and generates a first offset adjustment signal for adjusting an offset of the first sampler circuit based on an output of the first sampler circuit that is output in response to the first offset clock signal.