Semiconductor Output Driver Slew Rate Control
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Solution Overview
Problem
Semiconductor devices face challenges in maintaining a stable slew rate for data output as temperature variations affect transistor properties and delay circuits, leading to reduced valid data windows and difficulty in recognizing data at high temperatures.
Innovation Solution
Incorporating an on-die thermal sensor (ODTS) to detect internal temperature and an output driver that controls slew rate based on temperature information, either increasing or decreasing it proportionally or inversely, to maintain a uniform slew rate and reduce current consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If temperature increases, then current consumption increases, but slew rate decreases leading to reduced valid data window
Solution Approach 1:
The output driver dynamically adjusts its slew rate based on detected temperature conditions. At high temperatures, the driver increases slew rate to compensate for transistor performance degradation and maintain valid data window. At low temperatures, it reduces slew rate to minimize current consumption. This dynamic adaptation resolves the contradiction between maintaining reliability and reducing energy use.
Solution Approach 2:
The patent changes the slew rate parameter according to temperature conditions. By detecting temperature and adjusting the slew rate parameter accordingly, the system optimizes the balance between valid data window (reliability) and current consumption. The slew rate is increased at high temperatures to maintain signal integrity and decreased at low temperatures to reduce power usage.
2Reliability
If slew rate is increased to maintain valid data window at high temperature, then current consumption increases
Solution Approach 1:
The output driver implements dynamic slew rate adjustment based on real-time temperature detection. When temperature rises and threatens to reduce the valid data window, the driver automatically increases slew rate to maintain reliability. When temperature is low and allows for lower slew rates, current consumption is reduced. This dynamic behavior eliminates the need for constant high current consumption while maintaining reliability across temperature ranges.
3Use of energy by moving object
If slew rate is decreased to reduce current consumption, then valid data window is reduced
Solution Approach 1:
The patent adjusts the slew rate parameter based on temperature conditions to optimize the balance between current consumption and valid data window. At low temperatures where transistors perform well, the slew rate is decreased to reduce current consumption without compromising the valid data window. At high temperatures, the slew rate is increased to maintain signal integrity. This parameter adaptation resolves the contradiction between energy efficiency and reliability.
Data Source
AI summary
Semiconductor device and data outputting method of the same includes an on die thermal sensor (ODTS) configured to output temperature information by detecting an internal temperature of the semiconductor device and an output driver configured to control a slew rate depending on the temperature information and output data.