Semiconductor Overheat Protection via ON Voltage Monitoring
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Solution Overview
Problem
Conventional overheat protection control devices for semiconductor elements require multiple temperature sensors, which increase the invalid region and reduce the efficiency of circuit devices by limiting current flow and increasing costs, especially when dealing with multiple semiconductor elements.
Innovation Solution
An overheat protection control device that measures ON voltage and ON current between the source and drain of semiconductor elements to determine if they are in a normal or overheated state, eliminating the need for individual temperature sensors and reducing the invalid region.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a temperature sensor is arranged on each semiconductor element to measure temperature accurately, then measurement precision is improved, but the invalid region increases and productivity deteriorates
Solution Approach 1:
The invention extracts the temperature sensing function from dedicated temperature sensors and implements it using the semiconductor elements' own electrical characteristics (ON voltage and ON current). By measuring the relationship between ON voltage and ON current, the system determines temperature without requiring separate temperature sensor components on each semiconductor element, thus eliminating the invalid region problem while maintaining measurement capability
Solution Approach 2:
The semiconductor elements serve their own temperature monitoring function by providing electrical characteristics (ON voltage and ON current) that inherently contain temperature information. The control device utilizes these self-provided electrical parameters to determine temperature and apply overheat protection, eliminating the need for external temperature sensors and their associated invalid regions
2Reliability
If multiple temperature sensors are installed to monitor multiple semiconductor elements, then reliability is improved, but device complexity increases and cost increases
Solution Approach 1:
The invention makes the control device universal by enabling it to monitor multiple semiconductor elements using a single measurement system. The control device measures ON voltage and ON current and determines temperature for any number of semiconductor elements through calculation, making the monitoring system adaptable to different configurations without requiring additional temperature sensors for each element
Solution Approach 2:
Instead of physically copying temperature sensors for each semiconductor element, the invention creates a virtual copy of temperature information through calculation. By measuring ON voltage and ON current and using predetermined relationships, the system reproduces temperature data without physical temperature sensors, reducing component count while maintaining monitoring coverage
3Productivity
If the size of semiconductor elements is increased to compensate for performance degradation, then productivity is improved, but cost increases significantly
Solution Approach 1:
The invention changes the measurement parameters from direct temperature sensing to electrical characteristic measurement (ON voltage and ON current). By utilizing the relationship between electrical parameters and temperature, the system achieves accurate temperature monitoring without requiring larger semiconductor elements, maintaining performance while avoiding the cost increase associated with larger components
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for highly accurate overheat protection without increasing the invalid region, improving efficiency and reducing costs by enabling precise monitoring of semiconductor elements' states without the need for temperature sensors.
Implementation Method 1
a voltage measurement unit (10) that measures an ON voltage between a source of a first semiconductor element (1a to 1f) and a drain of the first semiconductor element
Data Source
AI summary
A plurality of semiconductor elements have sources which are commonly connected, and drains which are commonly connected. A voltage measurement unit measures an ON voltage between the source of a first semiconductor element of the plurality of semiconductor elements and the drain of the first semiconductor element. A determination unit receives information indicating a magnitude of an ON current between the source of the first semiconductor element and the drain of the first semiconductor element, and a measured value of the ON voltage in the voltage measurement unit, and determines whether the plurality of semiconductor elements are in a normal state or in an overheated state based on the measured value of the ON voltage and the received information indicating the magnitude of the ON current.