Semiconductor Package Cavity Layout for Compact Gate Connections
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Solution Overview
Problem
The semiconductor industry faces challenges in achieving high integration density while maintaining short gate connection distances and adequate creepage and clearance distances, which limits package size and thermal contact with heat sinks, especially in large packages.
Innovation Solution
A semiconductor package design featuring a substrate with a semiconductor die, electrical connector, and an encapsulant with a recess exposing the connector, allowing for a printed circuit board to be integrated within the recess, thereby reducing package size and enhancing thermal contact.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If standard lead configurations are used in higher voltage domains, then creepage and clearance distances are maintained, but package size increases
Solution Approach 1:
The patent transitions from a planar lead configuration to a three-dimensional cavity structure. The recess/cavity exposes the electrical connector at the bottom surface of the encapsulant, utilizing the vertical dimension to achieve adequate creepage and clearance distances without increasing the horizontal package footprint. This dimensional change allows compact packaging while maintaining electrical safety distances.
2Area of stationary object
If integration density is increased, then area on printed circuit board is reduced, but distance between gate connection and gate driver increases
Solution Approach 1:
The patent implements nesting by placing the gate driver die directly on the bottom surface of the recess/cavity, which already houses the exposed electrical connector. This nested arrangement minimizes the distance between the gate connection (electrical connector) and the gate driver, allowing high integration density on the printed circuit board without sacrificing signal performance.
3Quantity of substance
If package size is increased for large packages, then integration capacity is improved, but thermal contact with heat sink deteriorates due to package bow
Solution Approach 1:
The patent applies local quality by creating a recess/cavity in a specific location of the encapsulant where thermal contact is critical. The exposed electrical connector at the bottom surface of the recess provides a localized area for direct thermal and electrical connection to the heat sink, ensuring efficient heat dissipation in the critical region without compromising overall integration capacity.
Data Source
AI summary
A semiconductor package comprising a substrate, at least one semiconductor die disposed on the substrate, at least one electrical connector connected with the semiconductor die, an encapsulant covering the substrate, the at least one semiconductor die, and at least partially the electrical connector, the encapsulant comprising a recess formed into a main surface of the encapsulant, wherein the at least one electrical connector is exposed within the recess.


