Semiconductor Package Cavity Structure for Terminal Density and Reliability
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Solution Overview
Problem
Increasing the number of external connection terminals in semiconductor packages to enhance performance leads to increased manufacturing costs and planar area, making it challenging to balance performance and cost.
Innovation Solution
A semiconductor package design that includes a redistribution insulation layer, a connection structure with a base layer, metal pattern, and cavity, and a molding layer between the connection structure and the semiconductor chip, which prevents contact between the base layer and the redistribution insulation layer, thereby enhancing structural reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the number of external connection terminals is increased to enhance performance, then the performance is improved, but the planar area and manufacturing cost increase
Solution Approach 1:
The patent transitions from a two-dimensional planar arrangement of connection terminals to a three-dimensional vertical stacking architecture. Multiple semiconductor chips and connection structures are arranged in vertical layers, allowing increased number of external connection terminals without proportionally increasing the planar footprint. This dimensional change enables higher terminal density while controlling package area.
Solution Approach 2:
The patent implements nested structures where connection structures, metal patterns, and multiple chips are arranged concentrically and vertically within the package. The connection structures extend from the base layer through intermediate layers to upper chips, creating a nested configuration that maximizes the use of vertical space and increases terminal count without linearly increasing planar area.
2Reliability
If the number of external connection terminals is increased to enhance performance, then the performance is improved, but the manufacturing cost increases
Solution Approach 1:
The patent forms metal patterns and connection structures in advance during the manufacturing process, before final chip assembly. The metal patterns are pre-formed on base layers and intermediate structures, and connection structures are pre-assembled, enabling modular integration and reducing final assembly complexity. This preliminary action streamlines manufacturing and controls costs despite increased terminal count.
Solution Approach 2:
The patent divides the package into modular segments including base layers, intermediate connection structures, and upper chip assemblies. Each segment can be manufactured and prepared independently, then integrated through standardized connection interfaces. This segmentation enables parallel manufacturing processes and reduces overall manufacturing complexity and cost.
3Device complexity
If the base layer and redistribution insulation layer are in direct contact, then the structure is simpler, but defects in the base layer can affect the redistribution insulation layer, reducing reliability
Solution Approach 1:
The patent introduces an intermediate connection structure between the base layer and the redistribution insulation layer. This intermediate structure acts as a mediator that electrically and physically connects the two layers while providing isolation and protection. Defects in the base layer are contained and prevented from propagating to the redistribution insulation layer, enhancing overall structural reliability without excessive complexity.
Data Source
AI summary
A semiconductor package includes a redistribution insulation layer and a connection structure disposed on the redistribution insulation layer in a first direction and including a base layer, a metal pattern, and a cavity. A semiconductor chip is disposed on the redistribution insulation layer in the first direction. The semiconductor chip is spaced apart from the connection structure by a molding layer. The semiconductor chip and the molding layer are disposed in the cavity. The metal pattern is disposed on the redistribution insulation layer, at least partially between the base layer and the molding layer. The metal pattern includes a first metal pattern extending, in a second direction crossing the first direction, from an inner surface of the connection structure into the base layer and separating at least a portion of the base layer from at least a portion of the redistribution insulation layer.


