Semiconductor Package Grooves for Heat Dissipation and Insulation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
In semiconductor packages, the non-exposure of lead terminals from the package lower surface hinders effective heat radiation and insulation resistance, leading to increased temperature and reduced current density, especially when multiple lead terminals and die pads are adjacent, making it difficult to secure necessary insulation resistance.
Innovation Solution
The semiconductor package design exposes both die pads and lead terminals from the lower surface with grooves between them, allowing for improved heat radiation and securing creepage distances to ensure necessary insulation resistance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If lead terminals are not exposed from the package lower surface to secure insulation distance, then insulation resistance is improved, but heat radiation capability deteriorates
Solution Approach 1:
The package lower surface is segmented into multiple regions: exposed lead terminals for heat radiation, grooves for insulation spacing, and exposed die pads for additional heat radiation. This segmentation allows simultaneous optimization of heat dissipation and insulation by physically separating functional zones.
Solution Approach 2:
Different regions of the package lower surface are given different properties: lead terminals are exposed at specific locations for heat radiation, grooves are positioned between adjacent terminals to provide insulation, and die pads are exposed where heat dissipation is needed. Each local region is optimized for its specific function.
2Temperature
If multiple lead terminals are exposed on the package lower surface to improve heat radiation, then heat radiation capability is improved, but insulation distance among terminals deteriorates
Solution Approach 1:
Grooves are introduced as segmentation elements between adjacent lead terminals on the exposed lower surface. These grooves create physical separation that maintains insulation distance while allowing both terminals to remain exposed for heat radiation purposes.
Solution Approach 2:
The grooves act as intermediary structures between adjacent lead terminals. They provide the necessary insulation spacing without preventing the terminals from being exposed, thus mediating between the conflicting requirements of heat radiation and insulation.
3Power
If electric current is increased to improve power output, then power output is improved, but temperature of lead terminal exceeds allowable value
Solution Approach 1:
Heat radiation structures (exposed lead terminals and die pads) are prepared in advance on the package lower surface, creating preliminary heat dissipation pathways before high current operation. This preliminary preparation of thermal management structures prevents temperature exceedance during high power operation.
Solution Approach 2:
Heat dissipation is extended to the lower surface dimension by exposing lead terminals and die pads downward. This adds a third dimension (vertical heat radiation from lower surface) to the thermal management strategy, increasing overall heat dissipation capacity to support higher current operation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design enhances heat radiation and insulation resistance by allowing direct heat dissipation and securing adequate creepage distances between exposed components, thereby supporting higher current densities and reliable insulation.
Implementation Method 1
Heat generated in the lead terminal when an electric current is fed is radiated into the air
Data Source
AI summary
A semiconductor package includes: a plurality of die pads; a plurality of semiconductor chips provided on the plurality of die pads respectively; a plurality of lead terminals connected to the plurality of semiconductor chips respectively; and a package sealing the plurality of die pads, the plurality of semiconductor chips, and the plurality of lead terminals, the plurality of die pads and the plurality of lead terminals are exposed from a lower surface of the package, and on the lower surface of the package, grooves are provided among the die pads adjacent to one another and among the lead terminals adjacent to one another.


