Semiconductor Package RDL Integration Over Bonding Wire Structures

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Solution Overview

Problem

The existing fan out wafer level package manufacturing processes face difficulties in integrating semiconductor chips with bonding wiring structures due to incompatibility with redistribution wiring layers, making it challenging to perform redistribution wiring in wafer level.

Innovation Solution

The solution involves forming wiring bonding pads on a dummy substrate, stacking semiconductor chips, connecting them with bonding wires, and then forming a redistribution wiring layer on a mold substrate, which includes exposed wiring bonding pads to connect the redistribution wirings, allowing for the integration of chips with bonding wiring structures into the fan out wafer level package.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a redistribution wiring layer is formed on a semiconductor chip with a bonding wiring structure, then the fan out wafer level package can be manufactured, but it is difficult to perform the redistribution wiring process in wafer level due to incompatibility

Engineering Contradiction:
Improveredistribution wiring processVSAvoidcompatibility with bonding wiring structure
Core Design Contradiction:
Ease of manufactureVSAdaptability or versatility

Solution Approach 1:

The patent introduces an intermediary layer structure between the bonding wiring and redistribution wiring. Specifically, a planarization layer is formed over the bonding wiring structure, and through-holes are created in this planarization layer to access the bonding pads. This intermediary structure enables the redistribution wiring process to be performed on chips with bonding wiring structures by providing a suitable interface for wire bonding or other interconnection methods.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent segments the interconnection structure into distinct functional layers: the bonding wiring layer for chip-to-substrate connection, the planarization layer for surface flattening and access, and the redistribution wiring layer for signal routing. This segmentation allows each layer to be optimized for its specific function and enables the redistribution wiring process to be performed separately from the bonding process.

Inventive Principle:
Principle #1Segmentation

2Reliability

If bonding wires are used to connect chip pads to the substrate, then the chip can be mounted, but the wiring bonding pads are hidden under the mold layer making redistribution wiring difficult

Engineering Contradiction:
Improvechip mountingVSAvoidredistribution wiring access
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The patent transitions from a two-dimensional planar arrangement where bonding pads are on the chip surface to a three-dimensional structure where bonding pads are accessed through vertical through-holes in the mold layer. This dimensional change allows the bonding pads to remain connected to the chip while being accessible from the substrate side for redistribution wiring connection.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent performs preliminary actions by forming the planarization layer and through-holes in the mold layer before performing the redistribution wiring process. This preliminary preparation ensures that the bonding pads are accessible and properly positioned for subsequent wiring operations, making the redistribution process easier and more reliable.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11901348B2Semiconductor package and method of manufacturing the semiconductor package
Publication Date: 2024.02.13 SAMSUNG ELECTRONICS CO LTD
  • US11901348B2 patent drawing
  • US11901348B2 patent drawing
  • US11901348B2 patent drawing

AI summary

A semiconductor package includes a mold substrate, at least one first semiconductor chip in the mold substrate and including chip pads, wiring bonding pads formed at a first surface of the mold substrate and connected to the chip pads by bonding wires, and a redistribution wiring layer covering the first surface of the mold substrate and including redistribution wirings connected to the wiring bonding wirings.