3D Semiconductor Package EMI Shield Grounding
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Solution Overview
Problem
The increasing complexity and demand for miniaturization in electronic components pose challenges to the reliability and stability of wafer level packaging (WLP) technologies, particularly in managing electromagnetic interference (EMI) and ensuring the integrity of stacked semiconductor dies.
Innovation Solution
A 3D semiconductor package is developed with a conductive structure between stacked dies, including an active redistribution layer (RDL) for electrical communication and a dummy RDL for non-communication purposes, surrounded by insulative material, and equipped with an EMI shield configured as a shell connected to a conductive feature for grounding, enhancing protection against external EMI.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If wafer level packaging technology is used for miniaturization, then the size of electronic components is reduced, but electromagnetic interference and reliability issues increase
Solution Approach 1:
An EMI shield is introduced as an intermediary component between the semiconductor die and the external environment. The shield acts as a mediator that blocks electromagnetic interference from reaching sensitive internal structures, thereby resolving the reliability issue caused by miniaturization without sacrificing the compact size advantage of WLP technology.
Solution Approach 2:
The EMI shield is designed to preemptively counteract electromagnetic interference before it can affect the semiconductor die. By placing the shield around the die and conductive structures, the patent creates a protective barrier that neutralizes EMI threats in advance, preventing reliability issues before they occur.
2Adaptability or versatility
If more conductive structures are added for electrical communication, then functionality increases, but electromagnetic interference susceptibility increases
Solution Approach 1:
The EMI shield provides localized protection specifically around the conductive structures and semiconductor die where electrical communication occurs. Rather than shielding the entire package uniformly, the shield is strategically positioned to protect only the areas most susceptible to EMI while maintaining electrical functionality, thus resolving the contradiction between communication capability and EMI susceptibility.
3Object-affected harmful factors
If grounding structures are added for EMI protection, then EMI resistance improves, but device complexity increases
Solution Approach 1:
The EMI shield is merged with the existing packaging structure and grounding system. The shield is electrically connected to the substrate grounding, combining the EMI protection function with the existing structural framework. This integration approach provides effective EMI resistance while minimizing the increase in device complexity by reusing existing structural elements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution improves the reliability and stability of the 3D semiconductor package by effectively managing EMI, ensuring the integrity of semiconductor dies, and enhancing the package's structural integrity through the use of insulative materials and a conductive feature for grounding, thereby addressing the challenges of miniaturization and complexity in WLP technologies.
Implementation Method 1
The shield is in contact with the conductive feature such that the shield is electrically connected to a ground terminal through the conductive feature
Data Source
AI summary
A semiconductor device includes a semiconductor die having an insulative layer and a conductive feature in the insulative layer, and a shield in contact with a lateral surface of the conductive feature. In some embodiments, the lateral surface of the conductive feature is aligned with an edge of the insulating material.


