Semiconductor Packaging Ring for Warpage Control

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Solution Overview

Problem

Semiconductor devices face challenges in warpage control during packaging, which affects mechanical strain, reliability, and integration density, especially as components become smaller and more densely packed.

Innovation Solution

A ring and molding material are used around an integrated circuit die on a substrate to provide warpage control, with the ring offering mechanical support and the molding material encapsulating the die, reducing stress and enhancing reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If integration density is increased by reducing component size, then more components can be integrated into a given area, but warpage control becomes more difficult and mechanical strain increases

Engineering Contradiction:
Improveintegration densityVSAvoidwarpage control
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent divides the packaging structure into distinct functional segments: a rigid support ring, encapsulant material, and die attach structure. This segmentation allows each component to address specific mechanical challenges independently, with the ring providing warpage control and the encapsulant providing stress distribution, thereby maintaining reliability in high-density packages

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs composite material structures combining rigid ring materials (such as metal or ceramic) with flexible encapsulant materials (such as epoxy or polymer). This composite approach creates a structure that simultaneously provides mechanical support for warpage control and stress distribution, resolving the contradiction between high integration density and warpage control

Inventive Principle:
Principle #40Composite materials

2Area of stationary object

If component size is reduced to increase integration density, then package area is reduced, but mechanical stability and warpage control deteriorate

Engineering Contradiction:
Improvepackage areaVSAvoidmechanical stability
Core Design Contradiction:
Area of stationary objectVSStability of the object's composition

Solution Approach 1:

The patent applies local quality enhancement by placing a rigid ring structure specifically at the perimeter and critical stress zones of the package, while the central area contains the die and interconnect structures. This localized reinforcement provides mechanical stability and warpage control without increasing overall package area, as the rigid ring is positioned only where structurally necessary

Inventive Principle:
Principle #3Local quality

3Reliability

If encapsulant material is applied to protect the die, then reliability improves, but additional stress and warpage may be induced

Engineering Contradiction:
Improvedie protectionVSAvoidencapsulant stress
Core Design Contradiction:
ReliabilityVSStress or pressure

Solution Approach 1:

The patent applies preliminary anti-action by first establishing the rigid ring structure to define the package geometry and provide mechanical support, then applying the encapsulant material within the constraints of this pre-formed structure. The ring prevents the encapsulant from inducing excessive warpage by maintaining structural integrity during and after encapsulant curing, thereby counteracting the potential harmful stress before it can cause damage

Inventive Principle:
Principle #9Preliminary anti-action

Data Source

PatentUS9805997B2Packaging methods for semiconductor devices with encapsulant ring
Publication Date: 2017.10.31 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US9805997B2 patent drawing
  • US9805997B2 patent drawing
  • US9805997B2 patent drawing

AI summary

Packaging methods for semiconductor devices, and packaged semiconductor devices are disclosed. In some embodiments, a method of packaging a semiconductor device includes coupling a ring to a substrate, and coupling an integrated circuit die to the substrate within the ring. A molding material is disposed around the integrated circuit die within the ring.