Semiconductor Pad Layout for Inductance Minimization

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Solution Overview

Problem

Current semiconductor device pad layouts with pads arranged in a single row lead to increased inductance, causing power and ground noise issues, which hinder high-speed data transmission, especially in multi-bit components.

Innovation Solution

The implementation of a pad layout with two rows of pads in the central area of the semiconductor chip, where data power source and ground pads are placed in a checker pattern to minimize mutual inductance between lead wires, reducing effective inductance and noise, and allowing for high-speed data transmission.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If pads are arranged in a single row in the central area, then the device structure is simple and manufacturing is easier, but the inductance increases causing power and ground noise

Engineering Contradiction:
Improvepad layout simplicityVSAvoidpower and ground noise
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The patent transitions from a single-row pad arrangement to a two-row pad arrangement in the central area. This dimensional change allows data power source pads and ground pads to be interleaved in an alternating pattern across two rows, which reduces the loop area and effective inductance of the power and ground paths, thereby suppressing power and ground noise while maintaining manufacturing feasibility.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The pad layout is segmented into multiple functional groups (data pads, data power source pads, ground pads) arranged in alternating sequence across two rows. This segmentation allows each type of pad to be strategically positioned relative to others, creating multiple small current loops instead of large loops, which reduces inductance and electromagnetic noise.

Inventive Principle:
Principle #1Segmentation

2Object-affected harmful factors

If data power source and ground pads are placed close together, then the loop area is reduced and noise is minimized, but the layout complexity increases

Engineering Contradiction:
ImprovenoiseVSAvoidlayout complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent employs an asymmetric alternating pattern where data power source pads and ground pads are interleaved in a specific sequence (e.g., DQ0, VDDQ0, DQ1, VDDQ1, DQ2, VSSQ2, DQ3, VSSQ3) rather than symmetric grouping. This asymmetric arrangement optimizes the current path to minimize loop area and inductance while maintaining a regular enough pattern that can be systematically manufactured.

Inventive Principle:
Principle #4Asymmetry

3Productivity

If the number of pads is increased for multi-bit components, then the data transmission capacity increases, but the inductance and noise increase

Engineering Contradiction:
Improvedata transmission capacityVSAvoidinductance and noise
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

For multi-bit components, the patent extends the two-row alternating pattern to accommodate additional pads. Instead of adding pads in a single row which would increase inductance, the alternating pattern across two rows is maintained and expanded, ensuring that each additional data pad is paired with corresponding power and ground pads in close proximity, thus scaling capacity without proportionally increasing noise.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration reduces power and ground noise, enabling high-speed data transmission by minimizing effective inductance between lead wires for the data power source and ground, thus improving the semiconductor device's performance.

Implementation Method 1

Given pads included in the first and second pad layouts are wire bonded to solder ball lands of the BGA package substrate

Methodology Applied
Scientific EffectElectrical Conduction: Conduction (electrical)

Implementation Method 2

data power source and ground pads are placed in a checker pattern to minimize mutual inductance between lead wires, reducing effective inductance and noise

Methodology Applied
Scientific EffectElectromagnetic Induction: Electromagnetic Induction

Data Source

PatentUS7538431B2Semiconductor device
Publication Date: 2009.05.26 SEMICON PATENT
  • US7538431B2 patent drawing
  • US7538431B2 patent drawing
  • US7538431B2 patent drawing

AI summary

A semiconductor device is disclosed including a data family pad layout wherein an effort is made to contrive layouts of a power lead wire and a ground lead wire to minimize effective inductance in priority to a length of a lead wire between a pad and a solder ball land of a semiconductor chip. Pad layouts are arrayed in two rows and one unit of the pad layout is configured such that a data power source and ground are adjacent to each other or one data is inserted between the data power source and the ground. Such configurations decrease mutual inductance between the data power sources and increase mutual inductance between the data power source and the ground causing reduction in effective inductance between the data power source and the ground with the resultant minimization of power and ground noises.