Semiconductor Test Pad Switching for Single-Pad Voltage Supply
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Solution Overview
Problem
Conventional semiconductor test systems require multiple voltage pads for each device, limiting the number of devices that can be tested simultaneously due to the need for separate pads for different voltages, and are prone to back-powering issues during normal operations.
Innovation Solution
A semiconductor device and test system design that allows internal voltage generation and node coupling, enabling operation using a single pad during testing while separating voltage nodes during normal operations, reducing the number of pads required and preventing back-powering by using PMOS transistors and control signal generation units.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple voltage pads are allocated for each semiconductor device to supply different voltages, then the device can operate normally with separate voltage supplies, but the number of devices that can be tested simultaneously is limited
Solution Approach 1:
The patent merges multiple voltage supply functions into a single pad by implementing an internal voltage generation unit that creates multiple voltage levels (first voltage and second voltage) from a single input voltage received through one pad. This eliminates the need for multiple separate voltage pads while maintaining reliable voltage supply for all internal circuits.
Solution Approach 2:
The semiconductor device performs self-service by incorporating an internal voltage generation unit that autonomously generates multiple required voltage levels from a single input voltage. The device self-supplies all necessary voltages for its internal circuits without requiring external provision of multiple separate voltage sources, thereby enabling higher testing throughput.
2Device complexity
If nodes supplying different voltages are coupled together to enable single-pad operation, then the number of pads is reduced, but back-powering problems may occur during normal operations
Solution Approach 1:
The patent implements dynamic control of node coupling through a node coupling unit that selectively connects or disconnects nodes based on operational mode. During test operations, nodes are coupled to enable single-pad functionality; during normal operations, nodes are separated to prevent back-powering. This dynamic reconfiguration maintains both simplified pad structure and voltage isolation reliability.
Solution Approach 2:
The node coupling unit acts as an intermediary between voltage nodes, controlling their electrical connection state. It mediates between the conflicting requirements of node coupling (for single-pad operation) and node separation (for back-powering prevention) by selectively establishing or breaking connections based on operational context, thereby resolving the reliability concern.
3Productivity
If a single pad is used to supply voltage during test operation, then the number of semiconductor devices that can be tested at the same time increases, but the device cannot operate in normal mode with separate voltage inputs
Solution Approach 1:
The semiconductor device achieves universality by designing a single pad that serves multiple functions: it receives the input voltage for both test operations and normal operations. The internal voltage generation unit enables this single pad to support all voltage requirements for all internal circuits in both operational modes, eliminating the need for separate voltage pads while maintaining full operational flexibility.
Solution Approach 2:
The device dynamically adapts its internal voltage generation and node coupling based on the operational mode. During test operations, the system configures for single-pad input with internal voltage generation. During normal operations, it switches to receiving separate first and second voltages through the first and second pads respectively. This dynamic adaptability allows the device to achieve high testing throughput while maintaining full operational versatility.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient testing of multiple semiconductor devices simultaneously with reduced voltage pads and prevents back-powering by electrically coupling and separating nodes as needed, enhancing operational efficiency and reliability.
Implementation Method 1
an internal voltage generation unit suitable for shifting a voltage level of the first node to generate an internal voltage having the second voltage level
Data Source
AI summary
A semiconductor device may include a first node coupled to a first pad to which a first voltage having a first voltage level is inputted; a second node coupled to a second pad to which a second voltage having a second voltage level is inputted; an internal voltage generation unit suitable for shifting a voltage level of the first node to generate an internal voltage having the second voltage level, and outputting the internal voltage to third and fourth nodes; a first internal circuit suitable for operating by employing a voltage of the second node; and a node coupling unit that electrically couples the second node to the third node during a test operation, and electrically separates the second node and the third node during a normal operation.