Semiconductor Circuit Pattern Layout for Precise Chip Placement

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Pinpointing chip mounting positions is difficult and manufacturability is worsened when arranging semiconductor chips, leading to inefficiencies in semiconductor device assembly.

Innovation Solution

A semiconductor device design featuring a first circuit pattern with a recessed part and steps, where a second circuit pattern width increases downstream, and the recessed part width increases in a tiered manner, with semiconductor chips bonded onto the first pattern guided by these steps for precise positioning.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If semiconductor chips are arranged without specific positioning guides, then manufacturing process is simpler, but chip mounting position precision deteriorates

Engineering Contradiction:
Improvechip mounting position precisionVSAvoidcircuit pattern structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The first circuit pattern is segmented to include multiple steps at different heights, creating distinct positioning zones. These steps divide the mounting area into structured sections that guide chip placement, transforming a flat surface into a multi-level positioning structure without complicating the overall manufacturing process

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The steps on the first circuit pattern serve as intermediary positioning guides between the mounting structure and the semiconductor chips. These intermediate structures provide reference surfaces that facilitate precise chip placement while maintaining manufacturing simplicity

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If the second circuit pattern has uniform width, then manufacturing is easier, but electrical characteristics are unbalanced

Engineering Contradiction:
Improveelectrical characteristic balanceVSAvoidcircuit pattern manufacturing ease
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The second circuit pattern is designed with non-uniform width where different sections have different widths to optimize electrical characteristics. The pattern width varies locally to balance electrical properties such as current distribution and parasitic inductance, rather than maintaining a uniform width throughout

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The width parameter of the second circuit pattern is changed across different sections to achieve balanced electrical characteristics. By varying the width parameter spatially, the design optimizes electrical performance while the overall structure remains manufacturable

Inventive Principle:
Principle #35Parameter changes

3Object-affected harmful factors

If wires are longer to connect chips to circuit patterns, then routing is simpler, but parasitic inductance and temperature rise increase

Engineering Contradiction:
Improveparasitic inductance and temperature riseVSAvoidwire routing complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The circuit patterns are arranged in a three-dimensional configuration with steps at different heights, allowing wires to connect chips to circuit patterns in multiple spatial dimensions. This vertical arrangement reduces wire length by utilizing the Z-dimension, thereby decreasing parasitic inductance and temperature rise while maintaining routing simplicity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS12451465B2Semiconductor device
Publication Date: 2025.10.21 MITSUBISHI ELECTRIC CORP
  • US12451465B2 patent drawing
  • US12451465B2 patent drawing
  • US12451465B2 patent drawing

AI summary

A semiconductor device includes: a first circuit pattern having a recessed part in a planar view; a second circuit pattern positioned in the recessed part; a plurality of semiconductor chips bonded onto the first circuit pattern; and wires connecting top electrodes of the plurality of semiconductor chips to the second circuit pattern, wherein a width of the second circuit pattern increases from upstream to downstream on a current path by which a current flows through the second circuit pattern, and the first circuit pattern has a step in a planar view on a side of the recessed part, and a width of the recessed part increases in a tiered way to match an increase in the width of the second circuit pattern.