Power-Line Switch Control for Semiconductor Test and Power Gating
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Solution Overview
Problem
Current semiconductor devices require expensive testing equipment to coordinate control circuits for power gating and test operations, leading to inadequate stress application during accelerated tests and data transfer issues during input/output tests due to uncoordinated power gating functions.
Innovation Solution
A semiconductor device with a mode switching circuit that couples or isolates power lines based on signal logical values, allowing internal circuits to operate independently of control circuit signals during tests, ensuring consistent power supply and enabling efficient test modes without external test terminals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Use of energy by moving object
If a control circuit performs power gating operation to reduce power consumption, then power consumption is reduced, but test operations cannot be properly performed without expensive external testing equipment
Solution Approach 1:
The control circuit is designed to perform both power gating operation during normal operation and test control operation during testing. By making the control circuit universal, it can handle both power management and test coordination functions, eliminating the need for separate expensive external testing equipment while maintaining both power savings and test capability
Solution Approach 2:
The semiconductor device performs its own testing through the integrated control circuit that can coordinate both power gating and test operations. This self-service capability eliminates dependency on external testing equipment, reducing costs while maintaining full test functionality including accelerated testing and I/O testing
2Use of energy by moving object
If power gating function is activated during test operations, then power consumption is reduced, but stress application and data transfer are insufficient or blocked
Solution Approach 1:
The control circuit dynamically adjusts the power gating state based on the operational mode. During normal operation, power gating is activated to save power. During test operations, the control circuit detects the test mode and dynamically disables or modifies power gating to ensure sufficient stress application and proper data transfer, thus maintaining test reliability while preserving power benefits during normal use
Solution Approach 2:
The control circuit receives feedback about the operational state (normal operation vs. test operation) and adjusts the power gating function accordingly. This feedback mechanism ensures that power gating does not interfere with test operations while maintaining power savings during normal operation, resolving the conflict between power consumption and test reliability
3Reliability
If expensive testing equipment is used to coordinate control circuits, then test operation reliability is improved, but device complexity and cost increase
Solution Approach 1:
The patent extracts the test coordination functionality from external expensive testing equipment and integrates it into the semiconductor device's own control circuit. This extraction eliminates the need for complex external testing equipment while maintaining test operation reliability, as the control circuit itself handles the coordination of power gating and test operations
Solution Approach 2:
The control circuit merges multiple functions including power gating control, test operation coordination, and operational state detection into a single integrated unit. This merging reduces device complexity by eliminating the need for separate expensive testing equipment while maintaining full test functionality and reliability through the unified control mechanism
Data Source
AI summary
A semiconductor device whose operational state is switched between a test state and a normal operational state according to a logical value of a signal input from the outside is provided. The semiconductor device includes a first power line, a second power line, a switch that is controlled by a signal line to couple/isolate the first power line to/from the second power line, a control circuit that outputs a control signal, and a state switching circuit that drives the signal line to couple/isolate the first power line to/from the second power line according to a logical value of the control signal when the input signal is one of logical values, whereas the state switching circuit drives the signal line to couple the first power line to the second power line when the first signal is the other logical value.