Semiconductor Power Control for Fast Recovery From Voltage Faults

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Solution Overview

Problem

Semiconductor devices in automobiles face challenges in distinguishing between power-on and power abnormality cases due to the time required for initial diagnosis, which hinders prompt recovery from power abnormalities, and existing solutions that use external power failure detecting circuits and backup power supplies are costly and occupy large areas.

Innovation Solution

A semiconductor device with a control signal generating circuit that differentiates between power-on and power abnormality cases based on the fluctuation time of the power-supply voltage, allowing the operation sequence to change accordingly, thereby avoiding unnecessary initial diagnosis during power abnormalities.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If initial diagnosis is performed in power-on case, then diagnostic function is improved, but recovery time from power abnormality increases

Engineering Contradiction:
Improvediagnostic functionVSAvoidrecovery time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The invention changes the parameter of voltage fluctuation time to distinguish between power-on and power abnormality cases. By monitoring whether the voltage fluctuation time exceeds a predetermined threshold, the system can identify power abnormality conditions and skip the initial diagnosis procedure, thereby reducing recovery time while maintaining diagnostic functionality when needed.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If power failure detecting circuit and backup power supply are mounted, then distinction between power-on and power abnormality is improved, but device area and cost increase

Engineering Contradiction:
Improvedistinction capabilityVSAvoiddevice area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The invention extracts the essential function of distinguishing power-on from power abnormality by using only the voltage fluctuation time parameter from the existing power supply voltage, eliminating the need for separate power failure detecting circuits and backup power supplies. This reduces device area while maintaining the distinction capability.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The invention enables the power supply voltage itself to provide the distinction information through its fluctuation time characteristics, without requiring external detection circuits. The existing power supply voltage signal serves dual purposes: powering the device and providing diagnostic information about power conditions.

Inventive Principle:
Principle #25Self-service

3Reliability

If initial diagnosis is performed in power abnormality case, then diagnostic function is improved, but operation recovery speed decreases

Engineering Contradiction:
Improvediagnostic functionVSAvoidoperation recovery speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The invention uses voltage fluctuation time as a discriminating parameter to identify power abnormality conditions. When the voltage fluctuation time is determined to be shorter than the predetermined time (indicating power abnormality), the system skips the initial diagnosis and directly recovers normal operation, thereby maintaining high productivity while preserving diagnostic capability for genuine power-on scenarios.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentEP3211508B1Semiconductor device
Publication Date: 2020.10.14 HITACHI AUTOMOTIVE SYST LTD
  • EP3211508B1 patent drawingFigure 1~3
  • EP3211508B1 patent drawingFigure 4~5
  • EP3211508B1 patent drawingFigure 6~7

AI summary

The purpose of the present invention is to provide a semiconductor device that is small and has diagnosability, and that can quickly recover from power source malfunctions. Provided is a semiconductor device that includes: a control signal generation circuit that generates control signals which differ according to the fluctuation time of power-source voltage; and a control circuit that changes an operation sequence according to the differences in the control signals.