Semiconductor Device Manufacturing with Protective Insulating Layer

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Solution Overview

Problem

In semiconductor device manufacturing, existing technologies face challenges in preserving the integrity of dielectric and conductive layers during processing, leading to defects and reduced electrical performance due to exposure to cleaning agents and etching processes.

Innovation Solution

A method involving the formation of a recess in the semiconductor device with a dielectric layer lining the recess and a conductive structure partially filling it, followed by covering the top surfaces of these layers with a second insulating layer to protect them from cleaning processes, thereby preventing etching and maintaining layer integrity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If cleaning processes are applied to remove contaminants from semiconductor devices, then cleanliness is improved, but defects and resistance drift occur due to exposure of dielectric and conductive layers to cleaning agents

Engineering Contradiction:
ImprovecleanlinessVSAvoiddefects and resistance drift
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

A protective layer is introduced as an intermediary between the cleaning agents and the sensitive dielectric/conductive layers. This protective layer allows the cleaning process to proceed while preventing direct contact between cleaning agents and the layers that would otherwise suffer defects and resistance drift.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The dielectric and conductive layers are formed and positioned before the cleaning process is applied. By preparing the structure in advance with proper layer formation and positioning, the subsequent cleaning process can be performed without exposing these layers to harmful agents, thus preventing defects and resistance drift while maintaining cleanliness.

Inventive Principle:
Principle #10Preliminary action

2Manufacturing precision

If etching processes are used to pattern semiconductor structures, then manufacturing precision is improved, but layer integrity deteriorates due to exposure of dielectric and conductive layers to etching agents

Engineering Contradiction:
Improvepatterning accuracyVSAvoidlayer integrity
Core Design Contradiction:
Manufacturing precisionVSStability of the object's composition

Solution Approach 1:

The protective layer serves as an intermediary that allows etching processes to pattern the semiconductor structure with high precision while preventing etching agents from directly contacting and damaging the dielectric and conductive layers, thus maintaining layer integrity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The dielectric and conductive layers are formed with proper composition and structure before the etching process. This preliminary preparation ensures that when etching is applied for patterning, the layers maintain their integrity while achieving the required manufacturing precision.

Inventive Principle:
Principle #10Preliminary action

3Ease of operation

If dielectric and conductive layers are exposed during processing, then accessibility for manufacturing is improved, but electrical performance deteriorates due to contamination and damage

Engineering Contradiction:
ImproveaccessibilityVSAvoidelectrical performance
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The protective layer acts as an intermediary that maintains accessibility for manufacturing operations while preventing contamination and damage to the dielectric and conductive layers, thereby preserving electrical performance.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The layers are formed and positioned in advance before any processing that might cause contamination or damage. This preliminary action ensures that when subsequent manufacturing steps are performed, the layers remain protected and electrical performance is maintained.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS9570319B2Method of manufacturing a semiconductor device
Publication Date: 2017.02.14 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US9570319B2 patent drawing
  • US9570319B2 patent drawing
  • US9570319B2 patent drawing

AI summary

Semiconductor devices and methods of manufacture thereof are disclosed. In some embodiments, a method of manufacturing a semiconductor device includes: providing a workpiece having a recess and a dielectric layer lining the recess; forming a conductive structure within the recess, wherein the conductive structure partially fills the recess; and recessing the dielectric layer, wherein, after the recessing, a top surface of the recessed dielectric layer is disposed within the recess.