Semiconductor Pumping Voltage Generation Using Segmented Stages
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Solution Overview
Problem
Semiconductor integrated circuits, particularly semiconductor memory apparatuses, face increased current consumption and stress due to the need for higher pumping voltages, which can lead to defective circuits and reduced reliability during the burn-in test process.
Innovation Solution
A pumping voltage generating apparatus that includes a detection signal generating unit, a pumping unit, and a voltage selecting unit to adjust and output a pumping voltage using a combination of external voltages, allowing for reduced pumping and circuit size while minimizing stress by selectively using a lower second external voltage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Power
If a larger amount of pumping is performed to generate higher voltage, then the voltage generation capability is improved, but the current consumption and circuit size increase
Solution Approach 1:
The voltage pumping process is divided into multiple stages with different pumping amounts. The first pumping unit performs initial pumping with a first pumping amount, and the second pumping unit performs additional pumping with a second pumping amount that is smaller than the first. This segmentation allows the system to achieve the required voltage while reducing total current consumption and circuit size compared to a single large pumping operation.
2Power
If a larger amount of pumping is performed to generate higher voltage, then the voltage generation capability is improved, but the circuit size increases
Solution Approach 1:
The pumping circuit is segmented into multiple pumping units with different pumping amounts. This allows the use of smaller, more efficient pumping circuits rather than a single large pumping circuit, thereby reducing overall circuit area while achieving the required voltage generation capability.
3Power
If an internal pumping voltage almost twice the external pumping voltage is generated, then the voltage generation capability is improved, but stress and reliability issues occur
Solution Approach 1:
Instead of generating a single high voltage (almost twice the external voltage) in one pumping operation, the system segments the voltage generation into multiple stages. The first pumping unit generates an intermediate voltage, and the second pumping unit adds a smaller voltage increment. This segmentation reduces stress on the circuit during pumping operations, improving reliability while still achieving the required final voltage.
Solution Approach 2:
The system changes the pumping parameters by using different pumping amounts in different stages. The first pumping amount is larger to establish the base voltage, while the second pumping amount is smaller to reach the final voltage with reduced stress. This parameter change approach prevents the high stress associated with single-stage high-ratio voltage multiplication.
Data Source
AI summary
A pumping voltage generating apparatus includes a detection signal generating unit that generates a detection signal when a pumping voltage is lower than a reference value. A pumping unit elevates a first external voltage by a second external voltage to be output as the pumping voltage, in response to the detection signal. In this case, the second external voltage is lower than the first external voltage.