Semiconductor Recess for Inductor Coupling Precision
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Solution Overview
Problem
The challenge in semiconductor devices is to shorten the distance between inductors for improved communication precision while maintaining the physical protection function of the sealing resin layer, which is compromised by thickening the resin layer to reduce the distance between inductors.
Innovation Solution
A recess or opening is formed in the sealing resin layer to house the inductor, allowing for a thinner resin layer elsewhere to maintain protection functions, thereby reducing the distance between the inductor on the semiconductor chip and an external inductor without compromising physical protection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the sealing resin layer is made thick to ensure physical protection function, then the protection function is improved, but the distance between inductors is increased reducing communication precision
Solution Approach 1:
The sealing resin layer is designed with non-uniform thickness: a first thickness in the first region (above semiconductor chip) ensuring protection, and a second thickness (smaller than first) in the second region (above mounting board) reducing distance. This local differentiation resolves the contradiction by providing thick protection where needed while minimizing distance where communication occurs.
Solution Approach 2:
The solution transitions from uniform thickness (one-dimensional) to variable thickness (spatially differentiated) in the sealing resin layer. By introducing dimensional variation in the resin layer thickness across different regions, the patent simultaneously achieves both protection (thick region) and communication precision (thin region).
2Measurement precision
If the sealing resin layer is made thin to reduce distance between inductors, then communication precision is improved, but the physical protection function is compromised
Solution Approach 1:
The sealing resin layer is designed with non-uniform thickness: a first thickness in the first region (above semiconductor chip) ensuring protection, and a second thickness (smaller than first) in the second region (above mounting board) reducing distance. This local differentiation resolves the contradiction by providing thick protection where needed while minimizing distance where communication occurs.
3Measurement precision
If the distance between inductors is shortened to improve communication precision, then communication precision is improved, but the sealing resin layer thickness must be reduced compromising protection
Solution Approach 1:
The sealing resin layer is designed with non-uniform thickness: a first thickness in the first region (above semiconductor chip) ensuring protection, and a second thickness (smaller than first) in the second region (above mounting board) reducing distance. This local differentiation resolves the contradiction by providing thick protection where needed while minimizing distance where communication occurs.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively shortens the inductive coupling distance while ensuring the physical protection and insulation functions of the sealing resin layer, enhancing communication precision and handling ease.
Implementation Method 1
performing communication between a semiconductor device and the outside wirelessly by providing an inductor in a semiconductor chip and making the inductor inductively coupled to an external inductor
Data Source
AI summary
A semiconductor device, includes a substrate with a first surface, a semiconductor chip disposed over the first surface of the substrate, the semiconductor chip including a first region and a second region, and an encapsulant resin formed over the first surface of the substrate and encapsulating the semiconductor chip. The encapsulant resin has a thickness that is less at the first region of the semiconductor chip than that at the second region.


