Semiconductor Package Recess Layout for Stable Wire Bonding

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

In semiconductor light-emitting devices, connection failures between bonding wires and conductor patterns can occur due to the bleeding of die bond paste, leading to unreliable connections and manufacturing complexities, especially when the recess is not formed in the substrate regions.

Innovation Solution

The semiconductor device incorporates a substrate with patterned conductor layers and a recess in one region, where the semiconductor element is placed with a connection material, and bonding wires connected to the conductor patterns, with a peripheral wall and sealing material to enhance adhesion and prevent connection failures, and the recess is formed to reduce the wettability of the connection material, ensuring stable bonding.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If die bond paste is applied to connect the semiconductor element to the substrate, then bonding strength is improved, but the paste may bleed and cause connection failures between bonding wires and conductor patterns

Engineering Contradiction:
Improvebonding strengthVSAvoidconnection reliability
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

The patent introduces a recess structure as an intermediary element between the die bond paste and the conductor pattern. The recess acts as a physical barrier that confines the die bond paste within its application area, preventing it from bleeding onto the conductor patterns. This mediator structure enables both strong bonding and reliable wire connections by spatially separating the paste containment zone from the conductor zones.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent applies local quality by creating a recess specifically in the region where die bond paste is applied, while leaving the conductor pattern regions flat and accessible. This localized structural modification ensures that the paste is contained only where needed for bonding, while the conductor patterns remain exposed for reliable wire bonding, thus achieving both bonding strength and connection reliability in their respective zones.

Inventive Principle:
Principle #3Local quality

2Reliability

If a recess is formed in the substrate to prevent paste bleeding, then connection reliability is improved, but manufacturing complexity increases

Engineering Contradiction:
Improveconnection reliabilityVSAvoidsubstrate structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the substrate surface into distinct functional zones: a recessed area for die bond paste application and flat areas for conductor patterns. This segmentation is achieved through a simple etching process that creates discrete regions with different depths, allowing the substrate to serve multiple functions without requiring complex three-dimensional structures or additional components.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent modifies the substrate structure by changing the depth parameter (creating a recess) in a specific region, while maintaining the overall simplicity of the substrate design. This single parameter change (adding depth variation) is sufficient to prevent paste bleeding without introducing complex multi-layer structures, asymmetric geometries, or additional functional elements, thus achieving reliability improvement with minimal complexity increase.

Inventive Principle:
Principle #35Parameter changes

3Ease of operation

If the conductor layer is exposed for wire bonding, then ease of wire connection is improved, but die bond paste may spread onto the conductor causing connection failures

Engineering Contradiction:
Improvewire bonding easeVSAvoidconnection reliability
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The patent applies local quality by creating a recess specifically in the die bonding region while leaving the conductor pattern regions flat and exposed. This localized depth modification ensures that the die bond paste is contained within the recessed area during application, while the conductor patterns remain accessible in their own zone for reliable wire bonding. The spatial separation of these functions resolves the contradiction between paste containment and conductor accessibility.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration prevents connection failures between bonding wires and conductor patterns, simplifies the manufacturing process, and improves adhesion between the peripheral wall and the substrate, enhancing the reliability and efficiency of the semiconductor device.

Implementation Method 1

the recess is formed to reduce the wettability of the connection material

Methodology Applied
Scientific EffectWettability reduction: Wetting

Data Source

PatentUS20240072227A1Semiconductor device
Publication Date: 2024.02.29 ROHM CO LTD
  • US20240072227A1 patent drawing
  • US20240072227A1 patent drawing
  • US20240072227A1 patent drawing

AI summary

A semiconductor device includes: a substrate including a main surface; a semiconductor element; a connection material; a first bonding wire; and a second bonding wire, wherein the substrate includes a conductor layer on the main surface, the main surface includes a first and second regions, the conductor layer includes a first pattern in the first region and a second pattern in the second region, one and the other ends of the second bonding wire are respectively connected to the semiconductor element and the second pattern, a recess is formed in the first region and includes a first end and a second end which is opposite the first end and is closer to the second region than the first end in the first direction, and the first end is between the semiconductor element and the other end of the first bonding wire in the first direction.